Microfabrication of micro Hall sensors on GaAs and INSB for scanning hall probe microscopy

buir.advisorOral, Ahmet
dc.contributor.authorKaval, Mehmet Murat
dc.date.accessioned2016-01-08T18:01:12Z
dc.date.available2016-01-08T18:01:12Z
dc.date.issued2001
dc.descriptionAnkara : The Department of Physics and the Institute of Engineering and Sciences of Bilkent University, 2001.en_US
dc.descriptionThesis (Master's) -- Bilkent University, 2001.en_US
dc.descriptionIncludes bibliographical references leaves 57-59en_US
dc.description.abstractDifferent techniques have been developed to investigate the surface magnetic structure of materials, including Hall probe, scanning superconductivity quantum interference device (SQUID) and magnetic force microscopies (MFMs), Bitter decoration, Faraday rotation, and electron holography. Recently, the scanning Hall probe microscope (SHPM) has been shown to be a very sensitive, noninvasive instrument with which to obtain quantitative measurements of surface magnetic field profiles with high spatial resolution ( 120 nm)under variable temperature and magnetic field operation. In this thesis we are going to present microfabrication of Hall probes of < 1 micron on GaAs/AlGaAs 2DEG and InSb material to be used for Scanning Hall Probe Microscopy (SHPM) for magnetic imaging at sub-micron scale. First images obtained by InSb Hall probes will be presenteden_US
dc.description.provenanceMade available in DSpace on 2016-01-08T18:01:12Z (GMT). No. of bitstreams: 1 0001793.pdf: 2960139 bytes, checksum: e0ef5d3fd6d5686017bafc04ce4b69b9 (MD5)en
dc.description.statementofresponsibilityKaval, Mehmet Muraten_US
dc.format.extent59 leaves, illustrationsen_US
dc.identifier.urihttp://hdl.handle.net/11693/14520
dc.language.isoEnglishen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subject.lccQC611 .K38 2001en_US
dc.subject.lcshSemiconductors.en_US
dc.subject.lcshHall effects.en_US
dc.subject.lcshElectron holography.en_US
dc.titleMicrofabrication of micro Hall sensors on GaAs and INSB for scanning hall probe microscopyen_US
dc.typeThesisen_US
thesis.degree.disciplinePhysics
thesis.degree.grantorBilkent University
thesis.degree.levelMaster's
thesis.degree.nameMS (Master of Science)

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