Penetration depth of the scanning acoustic microscope
buir.contributor.orcid | Atalar, Abdullah|0000-0002-1903-1240 | |
dc.citation.epage | 167 | en_US |
dc.citation.issueNumber | 2 | en_US |
dc.citation.spage | 164 | en_US |
dc.citation.volumeNumber | 32 | en_US |
dc.contributor.author | Atalar, Abdullah | en_US |
dc.date.accessioned | 2019-03-28T06:21:42Z | |
dc.date.available | 2019-03-28T06:21:42Z | |
dc.date.issued | 1985-03 | en_US |
dc.department | Department of Electrical and Electronics Engineering | en_US |
dc.description.abstract | A definition for the penetration depth of the scanning reflection acoustic microscope is given. With this definition it is possible to calculate the penetration depth of a given lens geometry for a given material. The penetration depth depends on the elastic parameters of the object, the signal-to-noise ratio, and the operation frequency of the acoustic microscope. Calculations show that for high-impedance materials, the penetration depthis limited by the wavelength of the surface waves and hence by frequency. For low-impedance materials the opening angle of the lens can be properly selected to make the longitudinal or shear wave penetration dominant, effectively increasing the penetration well above the wavelength limit of the surface wave. | en_US |
dc.description.provenance | Submitted by Taner Korkmaz (tanerkorkmaz@bilkent.edu.tr) on 2019-03-28T06:21:42Z No. of bitstreams: 1 Penetration_Depth_of_the_Scanning_Acoustic_Microscope.pdf: 482278 bytes, checksum: cb32401c870d06dca50eb5c3c8400a83 (MD5) | en |
dc.description.provenance | Made available in DSpace on 2019-03-28T06:21:42Z (GMT). No. of bitstreams: 1 Penetration_Depth_of_the_Scanning_Acoustic_Microscope.pdf: 482278 bytes, checksum: cb32401c870d06dca50eb5c3c8400a83 (MD5) Previous issue date: 1985-03 | en |
dc.identifier.doi | 10.1109/T-SU.1985.31583 | en_US |
dc.identifier.eissn | 2162-1403 | |
dc.identifier.issn | 0018-9537 | |
dc.identifier.uri | http://hdl.handle.net/11693/50771 | |
dc.language.iso | English | en_US |
dc.publisher | IEEE | en_US |
dc.relation.isversionof | https://doi.org/10.1109/T-SU.1985.31583 | en_US |
dc.source.title | IEEE Transactions on Sonics and Ultrasonics | en_US |
dc.subject | Microscopy | en_US |
dc.subject | Lenses | en_US |
dc.subject | Optical surface waves | en_US |
dc.subject | Surface acoustic waves | en_US |
dc.subject | Signal to noise ratio | en_US |
dc.subject | Optical reflection | en_US |
dc.subject | Acoustic reflection | en_US |
dc.subject | Surface waves | en_US |
dc.subject | Geometry | en_US |
dc.subject | Optical materials | en_US |
dc.title | Penetration depth of the scanning acoustic microscope | en_US |
dc.type | Article | en_US |
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