Penetration depth of the scanning acoustic microscope

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buir.contributor.orcidAtalar, Abdullah|0000-0002-1903-1240
dc.citation.epage167en_US
dc.citation.issueNumber2en_US
dc.citation.spage164en_US
dc.citation.volumeNumber32en_US
dc.contributor.authorAtalar, Abdullahen_US
dc.date.accessioned2019-03-28T06:21:42Z
dc.date.available2019-03-28T06:21:42Z
dc.date.issued1985-03en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.description.abstractA definition for the penetration depth of the scanning reflection acoustic microscope is given. With this definition it is possible to calculate the penetration depth of a given lens geometry for a given material. The penetration depth depends on the elastic parameters of the object, the signal-to-noise ratio, and the operation frequency of the acoustic microscope. Calculations show that for high-impedance materials, the penetration depthis limited by the wavelength of the surface waves and hence by frequency. For low-impedance materials the opening angle of the lens can be properly selected to make the longitudinal or shear wave penetration dominant, effectively increasing the penetration well above the wavelength limit of the surface wave.en_US
dc.description.provenanceSubmitted by Taner Korkmaz (tanerkorkmaz@bilkent.edu.tr) on 2019-03-28T06:21:42Z No. of bitstreams: 1 Penetration_Depth_of_the_Scanning_Acoustic_Microscope.pdf: 482278 bytes, checksum: cb32401c870d06dca50eb5c3c8400a83 (MD5)en
dc.description.provenanceMade available in DSpace on 2019-03-28T06:21:42Z (GMT). No. of bitstreams: 1 Penetration_Depth_of_the_Scanning_Acoustic_Microscope.pdf: 482278 bytes, checksum: cb32401c870d06dca50eb5c3c8400a83 (MD5) Previous issue date: 1985-03en
dc.identifier.doi10.1109/T-SU.1985.31583en_US
dc.identifier.eissn2162-1403
dc.identifier.issn0018-9537
dc.identifier.urihttp://hdl.handle.net/11693/50771
dc.language.isoEnglishen_US
dc.publisherIEEEen_US
dc.relation.isversionofhttps://doi.org/10.1109/T-SU.1985.31583en_US
dc.source.titleIEEE Transactions on Sonics and Ultrasonicsen_US
dc.subjectMicroscopyen_US
dc.subjectLensesen_US
dc.subjectOptical surface wavesen_US
dc.subjectSurface acoustic wavesen_US
dc.subjectSignal to noise ratioen_US
dc.subjectOptical reflectionen_US
dc.subjectAcoustic reflectionen_US
dc.subjectSurface wavesen_US
dc.subjectGeometryen_US
dc.subjectOptical materialsen_US
dc.titlePenetration depth of the scanning acoustic microscopeen_US
dc.typeArticleen_US

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