Observation of negative refraction and focusing in two-dimensional photonic crystals

buir.contributor.authorÖzbay, Ekmel
buir.contributor.orcidÖzbay, Ekmel|0000-0003-2953-1828
dc.citation.epage6070en_US
dc.citation.issueNumber8 Aen_US
dc.citation.spage6064en_US
dc.citation.volumeNumber45en_US
dc.contributor.authorÖzbay, Ekmelen_US
dc.contributor.authorBulu, M.en_US
dc.contributor.authorGuven, K.en_US
dc.contributor.authorCaglayan, H.en_US
dc.contributor.authorAydin, K.en_US
dc.date.accessioned2016-02-08T10:18:29Z
dc.date.available2016-02-08T10:18:29Z
dc.date.issued2006en_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.departmentDepartment of Physicsen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.description.abstractWe experimentally and theoretically demonstrate the negative refraction and focusing of electromagnetic (EM) waves by twodimensional photonic crystal slabs at microwave frequencies. The negative refraction is observed both for transverse magnetic (TM) and transverse electric (TE) polarized incident EM waves. Gaussian beam shifting method is used to verify the negative refractive index. The Subwavelength imaging and flat lens behavior of photonic crystals are succesfully demonstrated. We have been able to overcome the diffraction limit and focus the EM waves to a spot size of 0.21λ. Metallodielectric photonic crystals are employed to increase the range of angle of incidence that results in negative refraction. Experimental results and theoretical calculations are in good agreement throughout the work. © 2006 The Japan Society of Applied Physics.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T10:18:29Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2006en
dc.identifier.doi10.1143/JJAP.45.6064en_US
dc.identifier.issn0021-4922
dc.identifier.urihttp://hdl.handle.net/11693/23742
dc.language.isoEnglishen_US
dc.publisherInstitute of Physics Publishing Ltd.en_US
dc.relation.isversionofhttp://dx.doi.org/10.1143/JJAP.45.6064en_US
dc.source.titleReviewed Japanese Journal of Applied Physicsen_US
dc.subjectBand diagramen_US
dc.subjectEqual frequency contoursen_US
dc.subjectFlat lensen_US
dc.subjectLeft-handed materialsen_US
dc.subjectMetamaterialen_US
dc.subjectNegative refractionen_US
dc.subjectPhotonic band gapen_US
dc.subjectPhotonic crystalsen_US
dc.subjectSubwavelength imagingen_US
dc.subjectElectromagnetic wavesen_US
dc.subjectImaging techniquesen_US
dc.subjectPhotonsen_US
dc.subjectRefractionen_US
dc.subjectRefractive indexen_US
dc.subjectBand diagramen_US
dc.subjectEqual frequency contoursen_US
dc.subjectFlat lensen_US
dc.subjectLeft handed materialsen_US
dc.subjectMetamaterialsen_US
dc.subjectNegative refractionen_US
dc.subjectPhotonic band gapen_US
dc.subjectPhotonic crystalsen_US
dc.subjectSubwavelength imagingen_US
dc.subjectCrystal structureen_US
dc.titleObservation of negative refraction and focusing in two-dimensional photonic crystalsen_US
dc.typeArticleen_US

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