Synthetic TEC mapping with kriging and random field priors

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buir.contributor.authorArıkan, Orhan
buir.contributor.orcidArıkan, Orhan|0000-0002-3698-8888
dc.contributor.authorSayın, I.en_US
dc.contributor.authorArıkan, F.en_US
dc.contributor.authorArıkan, Orhanen_US
dc.coverage.spatialEskişehir, Turkeyen_US
dc.date.accessioned2016-02-08T11:41:42Zen_US
dc.date.available2016-02-08T11:41:42Zen_US
dc.date.issued2007en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.descriptionDate of Conference: 11-13 June 2007en_US
dc.descriptionConference Name: 15th Signal Processing and Communications Applications, IEEE 2007en_US
dc.description.abstractTotal Electron Content (TEC) can be used for analyzing the variability of the ionosphere in space and time. In this study, spatial interpolation is implemented by Kriging and Random Field Priors (RFP), which are widely used in geostatistics. Performance of Kriging and RFP methods are analyzed on synthetic TEC data for different trend functions, sampling patterns, sampling numbers, variance and range values of covariance function which is used to simulate the synthetic data, by comparing the normalized errors of interpolations. In regular sampling patterns, as opposed to random sampling, the normalized average error is very close to each other for all methods and trend assumptions. The error increases with variance and decreases with range. As the number of samples increase, the normalized error also decreases.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T11:41:42Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2007en
dc.identifier.doi10.1109/SIU.2007.4298671en_US
dc.identifier.issn2165-0608en_US
dc.identifier.urihttp://hdl.handle.net/11693/27004en_US
dc.language.isoTurkishen_US
dc.publisherIEEEen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/SIU.2007.4298671en_US
dc.source.titleProceedings of the 15th Signal Processing and Communications Applications, IEEE 2007en_US
dc.subjectAverage errorsen_US
dc.subjectCovariance functionsen_US
dc.subjectGeo-statisticsen_US
dc.subjectKrigingen_US
dc.subjectRandom fielden_US
dc.subjectRandom samplingen_US
dc.subjectSampling patternsen_US
dc.subjectSpace and timeen_US
dc.subjectSpatial interpolationen_US
dc.subjectSynthetic dataen_US
dc.subjectTotal electron contenten_US
dc.subjectInterpolationen_US
dc.subjectRandom processesen_US
dc.subjectSignal processingen_US
dc.subjectError analysisen_US
dc.titleSynthetic TEC mapping with kriging and random field priorsen_US
dc.title.alternativeKriging ve rassal alan öncülü ile sentetik toplam elektron içeriği aradeğerlemesien_US
dc.typeConference Paperen_US

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Synthetic TEC mapping with kriging and random field priors [Kriging ve rassal alan öncülü ile sentetik toplam elektron i̇çeriǧi aradeǧerlemesi].pdf
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