XPS for probing the dynamics of surface voltage and photovoltage in GaN

buir.contributor.authorÖzbay, Ekmel
buir.contributor.authorSüzer, Şefik
buir.contributor.orcidÖzbay, Ekmel|0000-0003-2953-1828
dc.citation.epage30en_US
dc.citation.spage25en_US
dc.citation.volumeNumber323en_US
dc.contributor.authorSezen, H.en_US
dc.contributor.authorÖzbay, Ekmelen_US
dc.contributor.authorSüzer, Şefiken_US
dc.date.accessioned2015-07-28T12:01:35Z
dc.date.available2015-07-28T12:01:35Z
dc.date.issued2014-12-30en_US
dc.departmentDepartment of Physicsen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.departmentDepartment of Chemistryen_US
dc.description.abstractWe describe application of two different data gathering techniques of XPS for probing the dynamics of surface voltage and surface photovoltage (SPV) developed in microseconds to seconds time-domain, in addition to the conventional steady-state measurements. For the longer (seconds to milliseconds) regime, capturing the data in the snapshot fashion is used, but for the faster one (down to microseconds), square wave (SQW) electrical pulses at different frequencies are utilized to induce and probe the dynamics of various processes causing the surface voltage, including the SPV, via the changes in the peak positions. The frequency range covers anywhere from 10(-3) to 10(5) Hz for probing changes due to charging (slow), dipolar (intermediate), and electronic (fast) processes associated with the external stresses imposed. We demonstrate its power by application to n- and p-GaN, and discuss the chemical/physical information derived thereof. In addition, the method allows us to decompose and identify the peaks with respect to their charging nature for a composite sample containing both n- and p-GaN moieties.en_US
dc.identifier.doi10.1016/j.apsusc.2014.06.089en_US
dc.identifier.eissn1873-5584
dc.identifier.issn0169-4332
dc.identifier.urihttp://hdl.handle.net/11693/12459
dc.language.isoEnglishen_US
dc.publisherElsevieren_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/j.apsusc.2014.06.089en_US
dc.source.titleApplied Surface Scienceen_US
dc.subjectCharging Dynamicsen_US
dc.subjectSurface Photovoltageen_US
dc.subjectXPSen_US
dc.subjectGaNen_US
dc.subjectDopingen_US
dc.titleXPS for probing the dynamics of surface voltage and photovoltage in GaNen_US
dc.typeArticleen_US

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