Fault-tolerant topology generation method for application-specific network-on-chips

dc.citation.epage1508en_US
dc.citation.issueNumber9en_US
dc.citation.spage1495en_US
dc.citation.volumeNumber34en_US
dc.contributor.authorTosun, S.en_US
dc.contributor.authorAjabshir, V. B.en_US
dc.contributor.authorMercanoglu, O.en_US
dc.contributor.authorOzturk, O.en_US
dc.date.accessioned2016-02-08T09:41:23Z
dc.date.available2016-02-08T09:41:23Z
dc.date.issued2015en_US
dc.departmentDepartment of Computer Engineeringen_US
dc.description.abstractAs the technology sizes of integrated circuits (ICs) scale down rapidly, current transistor densities on chips dramatically increase. While nanometer feature sizes allow denser chip designs in each technology generation, fabricated ICs become more susceptible to wear-outs, causing operation failure. Even a single link failure within an on-chip fabric can halt communication between application blocks, which makes the entire chip useless. In this paper, we aim to make faulty chips designed with network-on-chip (NoC) communication usable. Specifically, we present fault-tolerant irregular topology-generation method for application-specific NoC designs. Designed NoC topology allows different routing path if there is a link failure on the default routing path. Additionally, we present a simulated annealing-based application mapping algorithm aiming to minimize total energy consumption of the NoC design. We compare fault-tolerant topologies with nonfault-tolerant application-specific irregular topologies on energy consumption, performance, and area using multimedia benchmarks and custom-generated graphs. Our results demonstrate that our method is able to determine fault-tolerant topologies with negligible area increase and better energy values.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T09:41:23Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2015en
dc.identifier.doi10.1109/TCAD.2015.2413848en_US
dc.identifier.eissn1937-4151en_US
dc.identifier.issn0278-0070en_US
dc.identifier.urihttp://hdl.handle.net/11693/21114en_US
dc.language.isoEnglishen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/TCAD.2015.2413848en_US
dc.source.titleIEEE Transactions on Computer - Aided Design of Integrated Circuits and Systemsen_US
dc.subjectEnergy minimizationen_US
dc.subjectBenchmarkingen_US
dc.subjectConformal mappingen_US
dc.subjectDesignen_US
dc.subjectDistributed computer systemsen_US
dc.subjectEnergy utilizationen_US
dc.subjectFault toleranceen_US
dc.subjectFault tolerant computer systemsen_US
dc.subjectMappingen_US
dc.subjectMicroprocessor chipsen_US
dc.subjectRoutersen_US
dc.subjectServersen_US
dc.subjectSimulated annealingen_US
dc.subjectTopologyen_US
dc.subjectVLSI circuitsen_US
dc.subjectApplication specificen_US
dc.subjectApplication specific network on chipen_US
dc.subjectEnergy minimizationen_US
dc.subjectIntegrated circuits (ICs)en_US
dc.subjectMultimedia benchmarksen_US
dc.subjectNetwork-on-chip (NoC)en_US
dc.subjectTopology designen_US
dc.subjectTotal energy consumptionen_US
dc.titleFault-tolerant topology generation method for application-specific network-on-chipsen_US
dc.typeArticleen_US

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