Effect of sample locations on computation of the exact scalar diffraction field (in English)

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dc.contributor.authorEsmer, G. B.en_US
dc.contributor.authorÖzaktaş, Haldun M.en_US
dc.contributor.authorOnural, Leventen_US
dc.coverage.spatialMuğla, Turkeyen_US
dc.date.accessioned2016-02-08T12:13:24Z
dc.date.available2016-02-08T12:13:24Z
dc.date.issued2012en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.descriptionDate of Conference: 18-20 April 2012en_US
dc.description.abstractComputer generated holography is one of common methods to obtain three-dimensional visualization. It can be explained by behavior of propagating waves and interference. To calculate the scalar diffraction pattern on a hologram, there are myriad of algorithms in the literature. Some of them employ several approximations, so the calculated fields may not be the exact scalar diffraction field. However, there are algorithms to compute the exact scalar diffraction field with some limitations on the distribution of the given samples over the space. These algorithms are based on "field model" approach. The performance of an algorithm, based on field model, is investigated according to the distribution of given samples over the space. From the simulations, it was observed that the cumulative information provided by the given samples has to be enough to solve the inverse scalar diffraction field. The cumulative information can be increased by having more samples, but there are some scenarios that differential information obtained from the given samples can be infinitesimal, thus the exact diffraction field may not be computed. © 2012 IEEE.en_US
dc.description.provenanceMade available in DSpace on 2016-02-08T12:13:24Z (GMT). No. of bitstreams: 1 bilkent-research-paper.pdf: 70227 bytes, checksum: 26e812c6f5156f83f0e77b261a471b5a (MD5) Previous issue date: 2012en
dc.identifier.doi10.1109/SIU.2012.6204493en_US
dc.identifier.issn2165-0608en_US
dc.identifier.urihttp://hdl.handle.net/11693/28180
dc.language.isoEnglishen_US
dc.language.isoTurkishen_US
dc.publisherIEEEen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/SIU.2012.6204493en_US
dc.source.title2012 20th Signal Processing and Communications Applications Conference (SIU)en_US
dc.subjectDifferential informationen_US
dc.subjectDiffraction fieldsen_US
dc.subjectField modelen_US
dc.subjectSample locationen_US
dc.subjectScalar diffractionen_US
dc.subjectThree dimensional visualizationen_US
dc.subjectAlgorithmsen_US
dc.subjectComputer generated holographyen_US
dc.subjectSignal processingen_US
dc.subjectThree dimensional computer graphicsen_US
dc.subjectVisualizationen_US
dc.subjectDiffractionen_US
dc.titleEffect of sample locations on computation of the exact scalar diffraction field (in English)en_US
dc.title.alternativeÖrnekleme yerlerinin skalar kirinim deseninin doğru hesaplanmasindaki etkisi (Türkçe)en_US
dc.typeConference Paperen_US

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Effect of sample locations on computation of the exact scalar diffraction field (in English) [Örnekleme yerleri̇ni̇n skalar kirinim deseni̇ni̇n doǧru hesaplanmasindaki̇ etki̇si̇ (Türkçe)].pdf
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