Analytical modelling of the interpixel thermal crosstalk in superconducting edge-transition bolometer arrays
Date
2006
Authors
Bozbey, A.
Fardmanesh, M.
Schubert, J.
Banzet, M.
Editor(s)
Advisor
Supervisor
Co-Advisor
Co-Supervisor
Instructor
Source Title
Superconductor Science and Technology
Print ISSN
0953-2048
Electronic ISSN
1361-6668
Publisher
Institute of Physics Publishing Ltd.
Volume
19
Issue
6
Pages
606 - 611
Language
English
Type
Journal Title
Journal ISSN
Volume Title
Series
Abstract
We present an analytical thermal model to explain the crosstalk in YBCO edge-transition bolometer arrays. The verification of the model was tested on sample array devices made of 200 and 400 nm YBCO films on LaAlO3 and SrTiO3 substrates. The model presented was able to explain the effects of the various physical parameters of the devices, such as the film thickness, operating temperature, and the device separation, which cause different response behaviours based on the variation of the related thermal crosstalk characteristics. In addition, the model is valid above the crosstalk-free modulation frequencies, where the effects of the thermal crosstalk on the response of the devices are negligible.