Publication:
Reduction in temperature-dependent fiber-optic gyroscope bias drift by using multifunctional integrated optical chip fabricated on pre-annealed LiNbO₃

buir.contributor.authorKaragöz, Ercan
buir.contributor.authorAşık, Fatma Yasemin
buir.contributor.authorGökkavas, Mutlu
buir.contributor.authorAkbaş, Erkut Emin
buir.contributor.authorYertutanol, Aylin
buir.contributor.authorÖzbay, Ekmel
buir.contributor.orcidKaragöz, Ercan|0000-0002-3352-7752
buir.contributor.orcidAşık, Fatma Yasemin|0000-0001-5309-1397
buir.contributor.orcidGökkavas, Mutlu|0000-0002-9244-4201
buir.contributor.orcidAkbaş, Erkut Emin|0009-0006-4268-0157
buir.contributor.orcidYertutanol, Aylin|0000-0002-8603-7554
buir.contributor.orcidÖzbay, Ekmel|0000-0003-2953-1828
dc.citation.epage14
dc.citation.issueNumber11
dc.citation.spage1
dc.citation.volumeNumber11
dc.contributor.authorKaragöz, Ercan
dc.contributor.authorAşık, Fatma Yasemin
dc.contributor.authorGökkavas, Mutlu
dc.contributor.authorAkbaş, Erkut Emin
dc.contributor.authorYertutanol, Aylin
dc.contributor.authorÖzbay, Ekmel
dc.contributor.authorÖzcan, Sadan
dc.date.accessioned2025-02-23T09:30:53Z
dc.date.available2025-02-23T09:30:53Z
dc.date.issued2024-12-11
dc.departmentNanotechnology Research Center (NANOTAM)
dc.departmentElectrical and Electronics Engineering
dc.departmentPhysics
dc.description.abstract The refractive index change obtained after annealed proton exchange (APE) in lithium niobate (LiNbO₃) crystals depends on both the proton exchange process carried out in hot acid and the structure of the crystals. In devices produced by the APE method, dislocations and lattice defects within the crystal structure are considered to be primary contributors to refractive index discontinuities and waveguide instability. In this study, the effects of pre-annealing LiNbO₃ crystals at 500 °C on multifunctional integrated optical chips (MIOCs) were investigated through interferometric fiber-optic gyroscope (IFOG) system-level tests. It was observed that the pre-annealing process resulted in an improvement in the optical throughput of MIOCs (from 34% to 51%) and the temperature-dependent bias drift stability of the IFOG (from 0.031–0.038°/h to 0.012–0.019°/h). The angle random walk (ARW) was measured as 0.0056 deg/√h.
dc.identifier.doi10.3390/photonics11111057
dc.identifier.eissn2304-6732
dc.identifier.urihttps://hdl.handle.net/11693/116674
dc.language.isoEnglish
dc.publisherMDPI AG
dc.relation.isversionofhttps://doi.org/10.3390/photonics11111057
dc.rightsCC BY 4.0 (Attribution 4.0 International Deed)
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.source.titlePhotonics
dc.subjectLithium niobate
dc.subjectMIOC
dc.subjectElectro-optical modulator
dc.subjectPre-annealing
dc.subjectFOG
dc.titleReduction in temperature-dependent fiber-optic gyroscope bias drift by using multifunctional integrated optical chip fabricated on pre-annealed LiNbO₃
dc.typeArticle
dspace.entity.typePublication

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