Browsing by Subject "ToF-SIMS"

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    ToF-SIMS depth profiling analysis of the uptake of Ba2+ and Co2+ ions by natural kaolinite clay
    (Academic Press, 2004) Shahwan, T.; Erten, H. N.; Black, L.; Allen, G. C.
    The sorption behavior of Ba2+ and Co2+ ions on a natural clay sample rich in kaolinite was studied using time-of-flight secondary ion mass spectrometry (ToF-SIMS). Depth profiling at 10-Å steps was performed up to a 70-Å matrix depth of the clay prior to and following sorption. The results showed that Co2+ is sorbed in slightly larger quantities than Ba2+, with significant numbers of ions fixed on the outermost surface of the clay. Depletion of the ions K+, Mg 2+, and Ca2+ from the clay lattice was observed to accompany enrichment with Co2+ and Ba2+ ions. The data obtained using X-ray powder diffraction (XRPD) and scanning electron microscopy (SEM) indicated insignificant structural and morphological changes in the lattice of the clay upon sorption of both Ba2+ and Co2+ ions. Analysis using energy dispersive X-ray spectroscopy (EDS) showed that the average atomic percentage (±S.D.) of Ba and Co on kaolinite surface were 0.49±0.11 and 0.61±0.19, respectively, indicating a limited uptake capacity of natural kaolinite for both ions. © 2004 Elsevier Inc. All rights reserved.