Browsing by Subject "Scattering mechanisms"
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Item Open Access Determination of scattering mechanisms in AlInGaN/GaN heterostructures grown on sapphire substrate(Elsevier, 2021-01-27) Sonmez, F.; Arslan, Engin; Ardali, S.; Tiras, E.; Özbay, EkmelThe electron mobility limited by different scattering mechanisms in the quaternary AlInGaN alloy grown on a GaN layer is investigated with the classical Hall measurement, which is performed at a temperature range of 12 and 350 K and a magnetic field of B = 0.51 T. The effect of the thickness and alloy composition of the quaternary AlInGaN layer on the mobility is also determined. The experimentally determined temperature-dependent Hall mobility was compared with mobility calculated by using Matthiessen's rule. The main scattering mechanisms, including acoustic phonon scattering (piezoelectric and deformation potential), polar optical phonon scattering, alloy disorder scattering, interface roughness scattering, ionized impurity scattering, dislocation scattering, background impurity scattering, were used in the calculations for all temperatures. The results show that the dominant scattering mechanisms, depending on the investigated sample, are the interface roughness scattering and alloy disorder scattering at almost all temperatures. At a low-temperature, mobility is limited by ionized impurity scattering. High-temperature mobility is limited by polar optical phonon scattering. Furthermore, our results suggest that the thickness and alloy composition of the quaternary AlInGaN layer should be optimized for better transport properties.Item Open Access Enhanced light scattering with energy downshifting using 16 nm indium nitride nanoparticles for improved thin-film a-Si N-i-P solar cells(Electrochemical Society Inc., 2015-05) Chowdhury F.I.; İslam, K.; Alkış, Sabri; Ortaç, Bülend; Alevli, Mustafa; Dietz, N.; Okyay, Ali Kemal; Nayfeh, A.In this work the effect of Indium nitride (InN) nanoparticles (NPs) on the performance of a-Si: H solar cells has been investigated. The average Jsc of InN NPs coated cells was found 6.76 mA/cm2 which is 16.69% higher than the average Jsc of the reference cell which was 5.79 mA/cm2. Average efficiency of InN NPs coated cells showed 14.16% increase from 3.32% to 3.79%. Peak EQE has increased from 44.8% at 500 nm to 51.67% at 510 nm and peak IQE has increased from 51.70% at 510 nm to 68.38% at 500 nm for InN NPs coated cell. Further study shows that EQE change is larger between 510 nm-700 nm compared to IQE change indicting a surface scattering mechanism that reduces the reflectivity. However, between 400 nm-510 nm IQE change is larger than EQE change which indicates that energy downshifting mechanism is dominating. So overall performance enhancement can be attributed to the scattering and photoluminescence properties of InN NPs that enhances absorption inside a-Si: H solar cells. © The Electrochemical Society.Item Open Access Mobility limiting scattering mechanisms in nitride-based two-dimensional heterostructures with the InGaN channel(IOP Publishing, 2010-03-16) Gökden, S.; Tülek, R.; Teke, A.; Leach, J. H.; Fan, Q.; Xie, J.; Özgür, Ü.; Morkoç, H.; Lisesivdin, S. B.; Özbay, EkmelThe scattering mechanisms limiting the carrier mobility in AlInN/AlN/InGaN/GaN two-dimensional electron gas (2DEG) heterostructures were investigated and compared with devices without InGaN channel. Although it is expected that InGaN will lead to relatively higher electron mobilities than GaN, Hall mobilities were measured to be much lower for samples with InGaN channels as compared to GaN. To investigate these observations the major scattering processes including acoustic and optical phonons, ionized impurity, interface roughness, dislocation and alloy disorder were applied to the temperature-dependent mobility data. It was found that scattering due mainly to interface roughness limits the electron mobility at low and intermediate temperatures for samples having InGaN channels. The room temperature electron mobilities which were determined by a combination of both optical phonon and interface roughness scattering were measured between 630 and 910 cm2 (V s)-1 with corresponding sheet carrier densities of 2.3-1.3 × 1013 cm-2. On the other hand, electron mobilities were mainly limited by intrinsic scattering processes such as acoustic and optical phonons over the whole temperature range for Al0.82In 0.18N/AlN/GaN and Al0.3Ga0.7N/AlN/GaN heterostructures where the room temperature electron mobilities were found to be 1630 and 1573 cm2 (V s)-1 with corresponding sheet carrier densities of 1.3 and 1.1 × 1013 cm-2, respectively. By these analyses, it could be concluded that the interfaces of HEMT structures with the InGaN channel layer are not as good as that of a conventional GaN channel where either AlGaN or AlInN barriers are used. It could also be pointed out that as the In content in the AlInN barrier layer increases the interface becomes smoother resulted in higher electron mobility.Item Open Access A novel effect of Electron Spin Resonance on electrical resistivity(Elsevier, 2018) Singh, N.; Rani, LuxmiWe extend the well known phenomenon of magnetoresistance (extra resistivity of materials in transverse magnetic field) to a regime where in addition to a transverse magnetic field, a transverse microwave field of resonant frequency is also applied. In a magnetic field, electron spin levels are Zeeman split. In a resonant microwave field, we uncover a new channel of momentum relaxation in which electrons in upper Zeeman level can deexcite to lower Zeeman level by generating spin fluctuation excitation in the lattice (similar to what happens in Electron Spin Resonance (ESR) spectroscopy). An additional resistivity due to this mechanism is predicted in which momentum randomization of Zeeman split electrons happen via bosonic excitations (spin fluctuations). An order of magnitude of this additional resistivity is calculated. The whole work is based upon an extension of Einstein’s derivation of equilibrium Planckian formula to near equilibrium systems.Item Open Access Scattering analysis of two-dimensional electrons in AlGaN/GaN with bulk related parameters extracted by simple parallel conduction extraction method(American Institute of Physics, 2010-07-15) Lisesivdin, S. B.; Yildiz, A.; Balkan, N.; Kasap, M.; Ozcelik, S.; Özbay, EkmelWe carried out the temperature (22-350 K) and magnetic field (0.05 and 1.4 T) dependent Hall mobility and carrier density measurements on Al 0.22Ga0.78N/GaN heterostructures with AlN interlayer grown by metal-organic chemical-vapor deposition. Hall data is analyzed with a simple parallel conduction extraction method and temperature dependent mobility and carrier densities of the bulk and two-dimensional (2D) electrons are extracted successfully. The results for the bulk carriers are discussed using a theoretical model that includes the most important scattering mechanisms that contribute to the mobility. In order to investigate the mobility of two-dimensional electron gas, we used a theoretical model that takes into account the polar optical phonon scattering, acoustic phonon scattering, background impurity scattering, and interface roughness scattering in 2D. In these calculations, the values are used for the deformation potential and ionized impurity density values were obtained from the bulk scattering analysis. Therefore, the number of fitting parameters was reduced from four to two. © 2010 American Institute of Physics.