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Browsing by Subject "Logic testing"

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    A new method for nonlinear circuit simulation in time domain: NOWE
    (Institute of Electrical and Electronics Engineers, 1996-03) Ocalı, O.; Tan, M. A.; Atalar, Abdullah
    A new method for the time-domain solution of general nonlinear dynamic circuits is presented. In this method, the solutions of the state variables are computed by using their time derivatives up to some order at the initial time instant. The computation of the higher order derivatives is equivalent to solving the same linear circuit for various sets of dc excitations. Once the time derivatives of the state variables are obtained, an approximation to the solution can be found as a polynomial rational function of time. The time derivatives of the approximation at the initial time instant are matched to those of the exact solution. This method is promising in terms of execution speed, since it can achieve the same accuracy as the trapezoidal approximation with much smaller number of matrix inversions.

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