Browsing by Subject "Line shape"

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    Fano effect in a double T-shaped interferometer
    (Springer, 2009) Moldoveanu, V.; Dinu, I. V.; Tanatar, Bilal
    We study the coherent transport in a one-dimensional lead with two side-coupled quantum dots using the Keldysh's Green function formalism.The effect of the interdot Coulomb interaction is taken into account by computing the firstand second order contributions to the self-energy.We show that the Fano interference due to the resonance of one dotis strongly affected by the fixed parameters that characterize the second dot. If the second dot is tuned close to resonance an additionalpeak develops between the peak and dip of the Fano line shape of the current. In contrast, when the second dotis off-resonance and its occupation number is close to unity the interdot Coulomb interaction merely shifts the Fano line and no other maxima appear.The system we consider is more general than the single-dot interferometer studied experimentally by Kobayashi et al. [Phys. Rev. B 70, 035319 (2004)] and may be used for controlling quantum interference and studying decoherence effects in mesoscopic transport.
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    Lineshapes, shifts and broadenings in dynamical X-ray photoelectron spectroscopy
    (2009) Dâna, A.
    We describe in detail a model that can be used to estimate the X-ray photoelectron spectroscopic data of surfaces when a time varying bias or a modulation of the electrical properties of the surface is applied by external stimulation, in the presence of a neutralizing electron beam. Using the model and spectra recorded under periodic sample bias modulation, certain electronic properties related to charging dynamics of the surface can be estimated. The resulting technique is a non-contact impedance measurement technique with chemical specificity. Typical behavior of spectra under a square wave bias is given. Alternative modulation schemes are investigated, including small-signal square wave modulation, sinusoidal modulation and modulation of sample resistivity under fixed bias. © 2009 Elsevier B.V. All rights reserved.