Browsing by Subject "Common cause failure"

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Open Access
Analysis of design parameters in safety-critical computers
(IEEE Computer Society, 2018) Ahangari, H.; Atik, F.; Ozkok, Y. I.; Yildirim, A.; Ata, S. O.; Ozturk, O.
Nowadays, safety-critical computers are extensively used in many civil domains like transportation including railways, avionics, and automotive. In evaluating these safety critical systems, previous studies considered different metrics, but some of safety design parameters like failure diagnostic coverage (C) or common cause failure (CCF) ratio have not been seriously taken into account. Moreover, in some cases safety has not been compared with standard safety integrity levels (IEC-61508: SIL1-SIL4) or even have not met them. Most often, it is not very clear that which part of the system is the Achilles heel and how design can be improved to reach standard safety levels. Motivated by such design ambiguities, we aim to study the effect of various design parameters on safety in some prevalent safety configurations, namely, 1oo2 and 2oo3, where 1oo1 is also used as a reference. By employing Markov modeling, we analyzed the sensitivity of safety to important parameters including: failure rate of processor, failure diagnostic coverage, CCF ratio, test and repair rates. This study aims to provide a deeper understanding on the influence of variation in design parameters over safety. Consequently, to meet appropriate safety integrity level, instead of improving some parts of a system blindly, it will be possible to make an informed decision on more relevant parameters. IEEE
Open Access
Analysis of design parameters in SIL-4 safety-critical computer
(IEEE, 2017-01) Ahangari, Hamzeh; Özkök, Y. I.; Yıldırım, A.; Say, F.; Atik, Funda; Öztürk, Özcan
Nowadays, Safety-critical computers are extensively used in may civil domains like transportation including railways, avionics and automotive. We noticed that in design of some previous works, some critical safety design parameters like failure diagnostic coverage (DC) or common cause failure (CCF) ratio have not been seriously taken into account. Moreover, in some cases safety has not been compared with standard safety levels (IEC-61508 SIL1-SIL4) or even have not met them. Most often, it is not very clear that which part of the system is the Achilles' heel and how design can be improved to reach standard safety levels. Motivated by such design ambiguities, we aim to study the effect of various design parameters on safety in some prevalent safety configurations: 1oo2 and 2oo3. 1oo1 is also used as a reference. By employing Markov modeling, sensitivity of safety to each of the following critical design parameters is analyzed: failure rate of processing element, failure diagnostics coverage, common cause failures and repair rates. This study gives a deeper sense regarding influence of variation in design parameters over safety. Consequently, to meet appropriate safety integrity level, instead of improving some system parts blindly, it will be possible to make an informed decision on more relevant parameters. © 2017 IEEE.