Browsing by Author "Deminskyi, P."
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Item Open Access Area-selective atomic layer deposition using an inductively coupled plasma polymerized fluorocarbon layer: A case study for metal oxides(American Chemical Society, 2016) Haider, A.; Deminskyi, P.; Khan, T. M.; Eren, H.; Bıyıklı, NecmiArea-selective atomic layer deposition (AS-ALD) has attracted immense attention in recent years for self-aligned accurate pattern placement with subnanometer thickness control. Here, we demonstrate a methodology to achieve AS-ALD by using inductively couple plasma (ICP) grown fluorocarbon polymer film as hydrophobic blocking layer for selective deposition. Our approach has been tested for metal-oxide materials including ZnO, Al2O3, and HfO2. Contact angle, X-ray photoelectron spectroscopy (XPS), spectroscopic ellipsometer, and scanning electron microscopy (SEM) measurements were performed to investigate the blocking ability of plasma polymerized fluorocarbon layers against ALD-grown metal-oxide films. A considerable growth inhibition for ZnO has been observed on fluorocarbon coated Si(100) surfaces, while the same polymerized surface caused a relatively slow nucleation for HfO2 films. No growth selectivity was obtained for Al2O3 films, displaying almost the same nucleation behavior on Si and fluorocarbon surfaces. Thin film patterning has been demonstrated using this strategy by growing ZnO on lithographically patterned fluorocarbon/Si samples. High resolution SEM images and XPS line scan confirmed the successful patterning of ZnO up to a film thickness of ∼15 nm. © 2016 American Chemical Society.Item Open Access Effect of substrate temperature and Ga source precursor on growth and material properties of GaN grown by hollow cathode plasma assisted atomic layer deposition(IEEE, 2016) Haider, Ali; Kizir, Seda; Deminskyi, P.; Tsymbalenko, Oleksandr; Leghari, Shahid Ali; Bıyıklı, Necmi; Alevli, M.; Gungor, N.GaN thin films grown by hollow cathode plasma-assisted atomic layer deposition (HCPA-ALD) at two different substrate temperatures (250 and 450 °C) are compared. Effect of two different Ga source materials named as trimethylgallium (TMG) and triethylgallium (TEG) on GaN growth and film quality is also investigated and reviewed. Films were characterized by X-ray photoelectron spectroscopy, spectroscopic ellipsometery, and grazing incidence X-ray diffraction. GaN film deposited by TMG revealed better structural, chemical, and optical properties in comparison with GaN film grown with TEG precursor. When compared on basis of different substrate temperature, GaN films grown at higher substrate temperature revealed better structural and optical properties.Item Open Access Graphene as plasma-compatible blocking layer material for area-selective atomic layer deposition: a feasibility study for III-nitrides(AVS Science and Technology Society, 2018) Deminskyi, P.; Haider A.; Kovalska, E.; Bıyıklı, NecmiPlasma-assisted atomic layer deposition (PA-ALD) is a promising method for low-temperature growth of III-nitride materials. However, selective film deposition using PA-ALD is challenging mainly due to the plasma-incompatibility of conventional deactivation/blocking layers including self-assembled monolayers and polymers. The main motivation behind this work is to explore alternative plasma-resistant blocking layer materials. Toward this goal, single/multilayered graphene (SLG/MLG) sheets were investigated as potential growth-blocking layers for III-nitride grown via PA-ALD. Prior to PA-ALD growth experiments, partially graphene-covered Si(100) samples were exposed to N2/H2 and N2-only plasma cycles to evaluate the plasma resistance of SLG and MLG. While SLG degraded fairly quickly showing signs of completely etched areas and rough surface morphology, MLG surface displayed certain degree of plasma-resistance. Based on this result, III-nitride PA-ALD experiments were carried out on MLG-patterned Si(100) samples. Crystalline III-nitride film deposition was observed on both Si(100) and graphene surfaces, confirming the rather ineffective nucleation blocking property of graphene surface against PA-ALD process. However, as graphene layers feature relatively weak van der Waals bonds at the substrate/graphene interface as well as between the multilayer graphene interfaces, conventional lift-off process was sufficient to remove the deposited excessive nitride films. InN and AlN-coated samples were ultrasonicated, and blocked/unblocked surfaces were characterized using scanning electron microscopy, x-ray photoelectron spectroscopy, and spectroscopic ellipsometer. While ∼50 nm thick films were measured in the open Si(100) areas, graphene-coated sample portions exhibited limited material growth in the range of 5-15 nm. Although not completely, the MLG surface has considerably blocked the PA-ALD growth process resulting in a usable thickness difference, enabling growth selectivity with postgrowth etch process. An Ar-based physical dry etching recipe was utilized to completely etch the unwanted nitride films from graphene coated area, while about 30 and 40 nm thick InN and AlN films remained on the nonblocked parts of the samples, respectively. As a result, selective deposition of PA-ALD grown AlN and InN has been achieved via graphene-assisted lift-off technique along with subsequent dry-etch process, achieving a maximum growth selectivity of ∼40 nm. With further process recipe optimization and integrating with a suitable patterning technique, the demonstrated graphene-assisted lift-off technique might offer an alternative feasible pathway toward area-selective deposition of III-nitrides and other plasma-necessitating materials.Item Open Access Long-range ordered vertical III-nitride nano-cylinder arrays: Via plasma-assisted atomic layer deposition(Royal Society of Chemistry, 2018) Haider A.; Deminskyi, P.; Yılmaz, Mehmet; Elmabruk, K.; Yilmaz, I.; Bıyıklı, NecmiIn this work, we demonstrate vertical GaN, AlN, and InN hollow nano-cylindrical arrays (HNCs) grown on Si substrates using anodized aluminum oxide (AAO) membrane templated lowerature plasma-assisted atomic layer deposition (PA-ALD). III-Nitride HNCs have been characterized for their structural, chemical, surface, and optical properties. The material properties of nanostructured III-nitride materials have been compared with the thin-film counterparts which were also grown using PA-ALD. Our results revealed that long-range ordered arrays of III nitride HNCs were successfully integrated on Si substrates and possess hexagonal polycrystalline wurtzite crystalline structure. Such long-range ordered wafer-scale III-nitride nanostructures might be potentially used in piezotronic sensing, energy harvesting, resistive memory, flexible and wearable electronics, III-nitride photovoltaics, and (photo)catalysis.Item Open Access Nanoscale selective area atomic layer deposition of TiO2 using e-beam patterned polymers(Royal Society of Chemistry, 2016) Haider A.; Yilmaz, M.; Deminskyi, P.; Eren, H.; Bıyıklı, NecmiHere, we report nano-patterning of TiO2via area selective atomic layer deposition (AS-ALD) using an e-beam patterned growth inhibition polymer. Poly(methylmethacrylate) (PMMA), polyvinylpyrrolidone (PVP), and octafluorocyclobutane (C4F8) were the polymeric materials studied where PMMA and PVP were deposited using spin coating and C4F8 was grown using inductively coupled plasma (ICP) polymerization. TiO2 was grown at 150 °C using tetrakis(dimethylamido) titanium (TDMAT) and H2O as titanium and oxygen precursors, respectively. Contact angle, scanning electron microscopy (SEM), spectroscopic ellipsometry, and X-ray photoelectron spectroscopy (XPS) measurements were performed to investigate the blocking/inhibition effectiveness of polymer layers for AS-ALD of TiO2. TiO2 was grown with different numbers of growth cycles (maximum = 1200 cycles) on PMMA, PVP, and C4F8 coated substrates, where PMMA revealed complete growth inhibition up to the maximum number of growth cycles. On the other hand, PVP was able to block TiO2 growth up to 300 growth cycles only, whereas C4F8 showed no TiO2-growth blocking capability. Finally, mm-, μm-, and nm-scale patterned selective deposition of TiO2 was demonstrated exploiting a PMMA masking layer that has been patterned using e-beam lithography. SEM, energy-dispersive X-ray spectroscopy (EDX) line scan, EDX elemental mapping, and XPS line scan measurements cumulatively confirmed the self-aligned deposition of TiO2 features. The results presented for the first time demonstrate the feasibility of achieving self-aligned TiO2 deposition via TDMAT/H2O precursor combination and e-beam patterned PMMA blocking layers with a complete inhibition for >50 nm-thick films.Item Open Access NLL-Assisted Multilayer Graphene Patterning(American Chemical Society, 2018) Kovalska, E.; Pavlov, I.; Deminskyi, P.; Baldycheva, A.; İlday, Fatih Ömer; Kocabas, C.The range of applications of diverse graphene-based devices could be limited by insufficient surface reactivity, unsatisfied shaping, or null energy gap of graphene. Engineering the graphene structure by laser techniques can adjust the transport properties and the surface area of graphene, providing devices of different nature with a higher capacitance. Additionally, the created periodic potential and appearance of the active external/inner/edge surface centers determine the multifunctionality of the graphene surface and corresponding devices. Here, we report on the first implementation of nonlinear laser lithography (NLL) for multilayer graphene (MLG) structuring, which offers a low-cost, single-step, and high-speed nanofabrication process. The NLL relies on the employment of a high repetition rate femtosecond Yb fiber laser that provides generation of highly reproducible, robust, uniform, and periodic nanostructures over a large surface area (1 cm2/15 s). NLL allows one to obtain clearly predesigned patterned graphene structures without fabrication tolerances, which are caused by contacting mask contamination, polymer residuals, and direct laser exposure of the graphene layers. We represent regularly patterned MLG (p-MLG) obtained by the chemical vapor deposition method on an NLL-structured Ni foil. We also demonstrate tuning of chemical (wettability) and electro-optical (transmittance and sheet resistance) properties of p-MLG by laser power adjustments. In conclusion, we show the great promise of fabricated devices, namely, supercapacitors, and Li-ion batteries by using NLL-assisted graphene patterning. Our approach demonstrates a new avenue to pattern graphene for multifunctional device engineering in optics, photonics, and bioelectronics.