Simultaneous measurement of multiple independent atomic-scale interactions using scanning probe microscopy: data interpretation and the effect of cross-talk

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dc.citation.epage6677en_US
dc.citation.issueNumber12en_US
dc.citation.spage6670en_US
dc.citation.volumeNumber119en_US
dc.contributor.authorBaykara, M. Z.en_US
dc.contributor.authorTodorović, M.en_US
dc.contributor.authorMönig, H.en_US
dc.contributor.authorSchwendemann, T. C.en_US
dc.contributor.authorRodrigo, L.en_US
dc.contributor.authorAltman, E. I.en_US
dc.contributor.authorPérez, R.en_US
dc.contributor.authorSchwarz, U. D.en_US
dc.date.accessioned2016-02-08T10:18:14Z
dc.date.available2016-02-08T10:18:14Z
dc.date.issued2015en_US
dc.departmentDepartment of Mechanical Engineeringen_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.description.abstractIn high-resolution scanning probe microscopy, it is becoming increasingly common to simultaneously record multiple channels representing different tip-sample interactions to collect complementary information about the sample surface. A popular choice involves simultaneous scanning tunneling microscopy (STM) and noncontact atomic force microscopy (NC-AFM) measurements, which are thought to reflect the chemical and electronic properties of the sample surface. With surface-oxidized Cu(100) as an example, we investigate whether atomic-scale information on chemical interactions can be reliably extracted from frequency shift maps obtained while using the tunneling current as the feedback parameter. Ab initio calculations of interaction forces between specific tip apexes and the surface are utilized to compare experiments with theoretical expectations. The examination reveals that constant-current operation may induce a noticeable influence of topography-feedback-induced cross-talk on the frequency shift data, resulting in misleading interpretations of local chemical interactions on the surface. Consequently, the need to apply methods such as 3D-AFM is emphasized when accurate conclusions about both the local charge density near the Fermi level, as provided by the STM channel, and the site-specific strength of tip-sample interactions (NC-AFM channel) are desired. We conclude by generalizing to the case where multiple atomic-scale interactions are being probed while only one of them is kept constant.en_US
dc.identifier.doi10.1021/acs.jpcc.5b00594en_US
dc.identifier.issn1932-7447
dc.identifier.urihttp://hdl.handle.net/11693/23725
dc.language.isoEnglishen_US
dc.publisherAmerican Chemical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1021/acs.jpcc.5b00594en_US
dc.source.titleJournal of Physical Chemistry Cen_US
dc.subjectAtomic force microscopyen_US
dc.subjectCalculationsen_US
dc.subjectCrosstalken_US
dc.subjectElectronic propertiesen_US
dc.subjectFrequency shift keyingen_US
dc.subjectHydrophobicityen_US
dc.subjectScanning probe microscopyen_US
dc.subjectSurface topographyen_US
dc.subjectAb initio calculationsen_US
dc.subjectAtomic-scale interactionen_US
dc.subjectChemical interactionsen_US
dc.subjectConstant current operationsen_US
dc.subjectHigh resolution scanningen_US
dc.subjectNoncontact atomic force microscopyen_US
dc.subjectSimultaneous measurementen_US
dc.subjectTip-sample interactionen_US
dc.subjectScanning tunneling microscopyen_US
dc.titleSimultaneous measurement of multiple independent atomic-scale interactions using scanning probe microscopy: data interpretation and the effect of cross-talken_US
dc.typeArticleen_US
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