BilKristal 4.0: A tool for crystal parameters extraction and defect quantification
Date
2015
Authors
Okuyan, E.
Okuyan, C.
Editor(s)
Advisor
Supervisor
Co-Advisor
Co-Supervisor
Instructor
Source Title
Computer Physics Communications
Print ISSN
104655
Electronic ISSN
Publisher
Elsevier
Volume
195
Issue
Pages
214 - 215
Language
English
Type
Journal Title
Journal ISSN
Volume Title
Series
Abstract
In this paper, we present a revised version of BilKristal 3.0 tool. Raycast screenshot functionality is added to provide improved visual analysis. We added atomic distance analysis functionality to assess crystalline defects. We improved visualization capabilities by adding high level cut function definitions. Discovered bugs are fixed and small performance optimizations are made. © 2015 Elsevier B.V. All rights reserved.
Course
Other identifiers
Book Title
Keywords
Basis vectors , Chemistry , Crystal , Crystallography , Material science , Pattern recognition , Primitive vectors , Space group , Symmetry , Application programming interfaces (API) , Atoms , C++ (programming language) , Chemistry , Computer graphics , Computer networks , Computer operating systems , Crystal atomic structure , Crystal defects , Crystal structure , Crystallography , Crystals , Information analysis , Information retrieval , Molecular graphics , Pattern recognition , Personal computers , Problem oriented languages , Software testing , Surface defects , Vector spaces , Vectors , Visualization , Volume rendering , Windows operating system , Basis vector , Direct volume rendering , Material science , Performance optimizations , Space Groups , Statistical information , Unstructured tetrahedral meshes , View dependent visualization , Crystal symmetry