Semiconductor and dielectric microcavity spectroscopy

buir.contributor.authorSerpengüzel, Ali
dc.citation.epage707en_US
dc.citation.issueNumber4en_US
dc.citation.spage701en_US
dc.citation.volumeNumber23en_US
dc.contributor.authorSerpengüzel, Alien_US
dc.date.accessioned2016-02-08T10:39:30Z
dc.date.available2016-02-08T10:39:30Z
dc.date.issued1999en_US
dc.departmentDepartment of Physicsen_US
dc.description.abstractSemiconductor and dielectric microcavities are used for the localization of photons as well as the enhancement of photon density of states. The enhancement of photoluminescence, electroluminescence, and lasing by the use of microcavities leads to novel active and passive optoelectronic and photonic devices such as channel droppping filters, semiconductor lasers, and resonant cavity enhanced devices. Experimental results showing photoluminescence enhancement in active planar, lasing in active ellipsoidal microcavities as well as light scattering in passive and spherical microcavities are presented.en_US
dc.identifier.issn1300-0101
dc.identifier.urihttp://hdl.handle.net/11693/25126
dc.language.isoEnglishen_US
dc.publisherTÜBİTAK
dc.source.titleTurkish Journal of Physicsen_US
dc.titleSemiconductor and dielectric microcavity spectroscopyen_US
dc.typeArticleen_US
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