Variable temperature Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback

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dc.citation.spage584en_US
dc.contributor.authorDede, Müniren_US
dc.contributor.authorÜrkmen, Korayen_US
dc.contributor.authorOral, Ahmeten_US
dc.contributor.authorFarrer, I.en_US
dc.contributor.authorRitchie, D. A.en_US
dc.coverage.spatialSan Diego, CA, USAen_US
dc.date.accessioned2016-02-08T11:46:07Z
dc.date.available2016-02-08T11:46:07Z
dc.date.issued2006en_US
dc.departmentDepartment of Physicsen_US
dc.descriptionDate of Conference: 8-12 May 2006en_US
dc.descriptionConference Name: IEEE International Magnetics Conference, INTERMAG 2006en_US
dc.description.abstractScanning Hall Probe Microscopy (SHPM) is a quantitative and non-invasive technique for imaging localized surface magnetic field fluctuations such as ferromagnetic domains. In this work, we have eliminated the difficulty in the cantilever-Hall probe integration process, just by gluing a Hall Probe chip to a quartz crystal tuning fork force sensor. The resultant SHPM can operate in variable temperature environment, 77-300 K.en_US
dc.identifier.doi10.1109/INTMAG.2006.376308en_US
dc.identifier.urihttp://hdl.handle.net/11693/27156
dc.language.isoEnglishen_US
dc.publisherIEEEen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/INTMAG.2006.376308en_US
dc.source.titleProceedings of the IEEE International Magnetics Conference, INTERMAG 2006en_US
dc.subjectTemperatureen_US
dc.subjectHall effect devicesen_US
dc.subjectAtomic force microscopyen_US
dc.subjectMagnetic force microscopyen_US
dc.subjectMagnetic fieldsen_US
dc.titleVariable temperature Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedbacken_US
dc.typeConference Paperen_US
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