Neutral particle mass spectrometry with nanomechanical systems

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dc.citation.volumeNumber6en_US
dc.contributor.authorSage, E.en_US
dc.contributor.authorBrenac, A.en_US
dc.contributor.authorAlava, T.en_US
dc.contributor.authorMorel, R.en_US
dc.contributor.authorDupré, C.en_US
dc.contributor.authorHanay, M.S.en_US
dc.contributor.authorRoukes, M.L.en_US
dc.contributor.authorDuraffourg L.en_US
dc.contributor.authorMasselon, C.en_US
dc.contributor.authorHentz, S.en_US
dc.date.accessioned2016-02-08T09:58:00Z
dc.date.available2016-02-08T09:58:00Z
dc.date.issued2015en_US
dc.departmentDepartment of Mechanical Engineeringen_US
dc.description.abstractCurrent approaches to mass spectrometry (MS) require ionization of the analytes of interest. For high-mass species, the resulting charge state distribution can be complex and difficult to interpret correctly. Here, using a setup comprising both conventional time-of-flight MS (TOF-MS) and nano-electromechanical systems-based MS (NEMS-MS) in situ, we show directly that NEMS-MS analysis is insensitive to charge state: the spectrum consists of a single peak whatever the speciesa' charge state, making it significantly clearer than existing MS analysis. In subsequent tests, all the charged particles are electrostatically removed from the beam, and unlike TOF-MS, NEMS-MS can still measure masses. This demonstrates the possibility to measure mass spectra for neutral particles. Thus, it is possible to envisage MS-based studies of analytes that are incompatible with current ionization techniques and the way is now open for the development of cutting-edge system architectures with unique analytical capability. © 2015 Macmillan Publishers Limited.en_US
dc.identifier.doi10.1038/ncomms7482en_US
dc.identifier.issn20411723
dc.identifier.urihttp://hdl.handle.net/11693/22281
dc.language.isoEnglishen_US
dc.publisherNature Publishing Groupen_US
dc.relation.isversionofhttp://dx.doi.org/10.1038/ncomms7482en_US
dc.source.titleNature Communicationsen_US
dc.subjectanalytical methoden_US
dc.subjectin situ testen_US
dc.subjectionizationen_US
dc.subjectmass spectrometryen_US
dc.subjectnanotechnologyen_US
dc.subjectparticle sizeen_US
dc.subjectArticleen_US
dc.subjectcontrolled studyen_US
dc.subjectelectrosprayen_US
dc.subjectionizationen_US
dc.subjectmass spectrometryen_US
dc.subjectmolecular mechanicsen_US
dc.subjectnanoelectromechanical systemen_US
dc.subjectneutral particle mass spectrometryen_US
dc.subjectstatic electricityen_US
dc.subjecttime of flight mass spectrometryen_US
dc.titleNeutral particle mass spectrometry with nanomechanical systemsen_US
dc.typeArticleen_US
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