Simulation of higher harmonics generation in tapping-mode atomic force microscopy

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buir.contributor.orcidAtalar, Abdullah|0000-0002-1903-1240
dc.citation.epage4457en_US
dc.citation.issueNumber26en_US
dc.citation.spage4455en_US
dc.citation.volumeNumber79en_US
dc.contributor.authorSahin, O.en_US
dc.contributor.authorAtalar, Abdullahen_US
dc.date.accessioned2016-02-08T10:33:53Z
dc.date.available2016-02-08T10:33:53Z
dc.date.issued2001en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.description.abstractIn tapping-mode atomic force microscopy, nonlinear tip-sample interactions give rise to higher harmonics of the cantilever vibration. We present an electrical circuit to model the atomic force microscope cantilever with its first three flexural eigenmodes. An electrical circuit simulator is used to simulate the tapping-mode operation. Amplitude and phase responses of the third flexural eigenmode are obtained for different sample properties. It is found that amplitude and phase of higher harmonics depend highly on sample properties. © 2001 American Institute of Physics.en_US
dc.identifier.doi10.1063/1.1429296en_US
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/11693/24754
dc.language.isoEnglishen_US
dc.publisherAmerican Institute of Physicsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1063/1.1429296en_US
dc.source.titleApplied Physics Lettersen_US
dc.titleSimulation of higher harmonics generation in tapping-mode atomic force microscopyen_US
dc.typeArticleen_US
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