Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement

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dc.citation.epage1303en_US
dc.citation.issueNumber5en_US
dc.citation.spage1299en_US
dc.citation.volumeNumber256en_US
dc.contributor.authorAtabak, M.en_US
dc.contributor.authorÜnverdi O.en_US
dc.contributor.authorÖzer H.O.en_US
dc.contributor.authorOral, A.en_US
dc.date.accessioned2016-02-08T10:00:56Z
dc.date.available2016-02-08T10:00:56Z
dc.date.issued2009en_US
dc.departmentDepartment of Physicsen_US
dc.description.abstractWe report the first results from novel sub-Angstrom oscillation amplitude non-contact atomic force microscopy developed for lateral force gradient measurements. Quantitative lateral force gradients between a tungsten tip and Si(1 1 1)-(7 × 7) surface can be measured using this microscope. Simultaneous lateral force gradient and scanning tunnelling microscope images of single and multi atomic steps are obtained. In our measurement, tunnel current is used as feedback. The lateral stiffness contrast has been observed to be 2.5 N/m at single atomic step, in contrast to 13 N/m at multi atomic step on Si(1 1 1) surface. We also carried out a series of lateral stiffness-distance spectroscopy. We observed lateral stiffness-distance curves exhibit sharp increase in the stiffness as the sample is approached towards the surface. We usually observed positive stiffness and sometimes going into slightly negative region. © 2009 Elsevier B.V. All rights reserved.en_US
dc.identifier.doi10.1016/j.apsusc.2009.10.026en_US
dc.identifier.issn1694332
dc.identifier.urihttp://hdl.handle.net/11693/22500
dc.language.isoEnglishen_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/j.apsusc.2009.10.026en_US
dc.source.titleApplied Surface Scienceen_US
dc.subjectLateral force gradient-distance spectroscopyen_US
dc.subjectNon-contact lateral atomic force microscopyen_US
dc.subjectSmall oscillation amplitudeen_US
dc.subjectLateral force gradient-distance spectroscopyen_US
dc.subjectLateral force gradientsen_US
dc.subjectNon-contacten_US
dc.subjectSmall oscillation amplitudeen_US
dc.subjectSmall oscillationsen_US
dc.subjectAtomic force microscopyen_US
dc.subjectAtomsen_US
dc.subjectStiffnessen_US
dc.subjectTungstenen_US
dc.subjectWind tunnelsen_US
dc.subjectAtomic spectroscopyen_US
dc.titleSub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurementen_US
dc.typeArticleen_US
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