Anisotropy sensitivity of an acoustic lens with slit aperture

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buir.contributor.orcidAtalar, Abdullah|0000-0002-1903-1240
dc.citation.epage616en_US
dc.citation.spage613en_US
dc.contributor.authorAtalar, Abdullahen_US
dc.contributor.authorIshikawa, I.en_US
dc.contributor.authorOgura, Y.en_US
dc.contributor.authorTomita, K.en_US
dc.coverage.spatialBaltimore, MD, USAen_US
dc.date.accessioned2016-02-08T12:01:53Z
dc.date.available2016-02-08T12:01:53Z
dc.date.issued1993en_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.descriptionDate of Conference: 31 October-3 November 1993en_US
dc.descriptionConference Name: 1993 IEEE Ultrasonics Symposiumen_US
dc.description.abstractA conventional spherical acoustic lens is modified by restricting its aperture in the form of a slit to provide directional sensitivity. The spacing between the two parallel absorbing sheets forming the slit is adjustable to obtain varying slit widths. The resulting lens can be used in conjunction with V(Z) method to obtain leaky wave velocities of the sample under investigation as a function of direction. The theoretical V(Z) analysis of the lens involves a two-dimensional integral rather than one-dimensional integral of the conventional lens. Single crystal anisotropic materials are chosen as test samples. Reflection coefficients for anisotropic single crystals of given surface cut and orientation are calculated. Numerically evaluated V(Z) curves are used to deduce the surface wave velocity of the object for the given orientation. This is compared with the surface wave velocity directly calculated from the elastic parameters of the object. Results show the compromise between signal-to-noise ratio and angular resolution as the slit width is varied. V(Z) measurement results of a slitted lens are presented to be compared with calculated curves. The new lens is used to measure the acoustic velocity on the (001) surface of GaAs along varying directions with differing slit widths.en_US
dc.identifier.doi10.1109/ULTSYM.1993.339525en_US
dc.identifier.issn1051-0117en_US
dc.identifier.urihttp://hdl.handle.net/11693/27794
dc.language.isoEnglishen_US
dc.publisherIEEEen_US
dc.relation.isversionofhttps://doi.org/10.1109/ULTSYM.1993.339525en_US
dc.source.titleProceedings of the 1993 IEEE Ultrasonics Symposiumen_US
dc.subjectAcoustic wave reflectionen_US
dc.subjectAcoustic wave velocity measurementen_US
dc.subjectAnisotropyen_US
dc.subjectCrystal orientationen_US
dc.subjectCrystalsen_US
dc.subjectElasticityen_US
dc.subjectIntegral equationsen_US
dc.subjectLensesen_US
dc.subjectSemiconducting gallium arsenideen_US
dc.subjectSensitivity analysisen_US
dc.subjectSignal to noise ratioen_US
dc.subjectSurface wavesen_US
dc.subjectAcoustic lensesen_US
dc.subjectDirectional sensitivityen_US
dc.subjectLeaky surface acoustic wavesen_US
dc.subjectSlit apertureen_US
dc.subjectV(Z) curvesen_US
dc.subjectAcoustic microscopesen_US
dc.titleAnisotropy sensitivity of an acoustic lens with slit apertureen_US
dc.typeConference Paperen_US
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