XPS and FTIR characterization of manganese ions deposited on alumina
Date
1999-05-25
Authors
Editor(s)
Advisor
Supervisor
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Co-Supervisor
Instructor
Source Title
Journal of Molecular Structure
Print ISSN
0022-2860
Electronic ISSN
Publisher
Elsevier
Volume
482-483
Issue
Pages
19 - 22
Language
English
Type
Journal Title
Journal ISSN
Volume Title
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Abstract
By application of XPS and FTIR spectroscopy of adsorbed CO the effect of preparation conditions on the state and localization of manganese ions deposited on h-Al2O3 is studied. Both Mn21 and Mn31 ions are observed on the impregnated sample. The sample obtained by ion exchange contains only Mn31 ions. The adsorbed CO species are identified. q 1999 Elsevier Science B.V. All rights reserved.