Lithography-free, manganese-based ultrabroadband absorption through annealing-based deformation of thin layers into metal–air composites

Date
2019-07-15
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Source Title
Optics Letters
Print ISSN
0146-9592
Electronic ISSN
1539-4794
Publisher
OSA - The Optical Society
Volume
44
Issue
14
Pages
3598 - 3601
Language
English
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Abstract

Fabrication, characterization, and analysis of an ultrabroadband lithography-free absorber is presented. An over 94% average absorption is experimentally achieved in the wavelength range of 450–1400 nm. This ultrabroadband absorption is obtained by a simple annealed trilayer metal–insulator–metal (MIM) configuration. The metal used in the structure is manganese (Mn), which also makes the structure cost-effective. It is shown that the structure retains its high absorption for TM polarization, up to 70 deg, and, for TE polarization, up to 50 deg. Moreover, the physical mechanism behind this broadband absorption is explained. Being both lithography-free and cost-effective, the structure is a perfect candidate for large-area and mass production purposes.

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Published Version (Please cite this version)