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dc.contributor.authorBaykara, Mehmet Z.en_US
dc.contributor.editorKumar, C. S. S. R.
dc.date.accessioned2019-05-23T11:12:35Z
dc.date.available2019-05-23T11:12:35Z
dc.date.issued2015en_US
dc.identifier.isbn9783662445501
dc.identifier.urihttp://hdl.handle.net/11693/51485
dc.description.abstractAmong the large variety of scanning probe microscopy techniques, noncontact atomic force microscopy (NC-AFM) stands out with its capability of atomic-resolution imaging and spectroscopy measurements on conducting, semiconducting as well as insulating sample surfaces. In this chapter, we review the fundamental experimental and instrumental methodology associated with the technique and present key results obtained on different classes of material surfaces. In addition to atomic-resolution imaging, the use of NC-AFM towards the goal of atomic-resolution force spectroscopy is emphasized.en_US
dc.language.isoEnglishen_US
dc.relation.ispartofSurface science tools for nanomaterials characterizationen_US
dc.relation.isversionofhttps://doi.org/10.1007/978-3-662-44551-8_8en_US
dc.relation.isversionofhttps://doi.org/10.1007/978-3-662-44551-8en_US
dc.subjectAtomic force microscopyen_US
dc.subjectAtomic force spectroscopyen_US
dc.titleNoncontact atomic force microscopy for atomic-scale characterization of material surfacesen_US
dc.typeBook Chapteren_US
dc.departmentDepartment of Mechanical Engineeringen_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.citation.spage273en_US
dc.citation.epage316en_US
dc.identifier.doi10.1007/978-3-662-44551-8en_US
dc.publisherSpringeren_US
dc.identifier.eisbn9783662445518


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