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dc.contributor.authorBaykara, Mehmet Z.en_US
dc.contributor.authorSchwarz, U. D.en_US
dc.contributor.editorLindon, J.
dc.contributor.editorTranter, G. E.
dc.contributor.editorKoppenaal, D.
dc.date.accessioned2019-04-23T07:57:19Z
dc.date.available2019-04-23T07:57:19Z
dc.date.issued2017en_US
dc.identifier.isbn9780128032244
dc.identifier.urihttp://hdl.handle.net/11693/50898
dc.description.abstractThis chapter provides an overview of atomic force microscopy, covering the fundamental aspects of the associated instrumentation and methodology as well as representative results from the literature highlighting a variety of application areas. In particular, atomic-resolution imaging and spectroscopy capabilities are emphasized, in addition to applications in biology, nanotribology and catalysis research. Finally, an outlook on emerging aspects and future prospects of atomic force microscopy is provided.en_US
dc.language.isoEnglishen_US
dc.relation.ispartofEncyclopedia of Spectroscopy and Spectrometryen_US
dc.relation.isversionofhttps://doi.org/10.1016/B978-0-12-409547-2.12141-9en_US
dc.subjectAdhesionen_US
dc.subjectAtomic force microscopyen_US
dc.subjectBiomaterialsen_US
dc.subjectCatalysisen_US
dc.subjectElasticityen_US
dc.subjectForce spectroscopyen_US
dc.subjectFrictionen_US
dc.subjectKelvin probe force microscopyen_US
dc.subjectMetalsen_US
dc.subjectMetal oxidesen_US
dc.subjectNanomechanicsen_US
dc.subjectNanotribologyen_US
dc.subjectScanning probe microscopyen_US
dc.subjectScanning tunneling microscopyen_US
dc.subjectSemiconductorsen_US
dc.titleAtomic force microscopy: Methods and applicationsen_US
dc.typeBook Chapteren_US
dc.departmentDepartment of Mechanical Engineeringen_US
dc.identifier.doi10.1016/B978-0-12-409547-2.12141-9en_US
dc.publisherElsevieren_US


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