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      Atomic force microscopy: Methods and applications

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      Author(s)
      Baykara, Mehmet Z.
      Schwarz, U. D.
      Editor
      Lindon, J.
      Tranter, G. E.
      Koppenaal, D.
      Date
      2017
      Publisher
      Elsevier
      Language
      English
      Type
      Book Chapter
      Item Usage Stats
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      Book Title
      Encyclopedia of Spectroscopy and Spectrometry
      Abstract
      This chapter provides an overview of atomic force microscopy, covering the fundamental aspects of the associated instrumentation and methodology as well as representative results from the literature highlighting a variety of application areas. In particular, atomic-resolution imaging and spectroscopy capabilities are emphasized, in addition to applications in biology, nanotribology and catalysis research. Finally, an outlook on emerging aspects and future prospects of atomic force microscopy is provided.
      Keywords
      Adhesion
      Atomic force microscopy
      Biomaterials
      Catalysis
      Elasticity
      Force spectroscopy
      Friction
      Kelvin probe force microscopy
      Metals
      Metal oxides
      Nanomechanics
      Nanotribology
      Scanning probe microscopy
      Scanning tunneling microscopy
      Semiconductors
      Permalink
      http://hdl.handle.net/11693/50898
      Published Version (Please cite this version)
      https://doi.org/10.1016/B978-0-12-409547-2.12141-9
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      • Department of Mechanical Engineering 330
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