• About
  • Policies
  • What is openaccess
  • Library
  • Contact
Advanced search
      View Item 
      •   BUIR Home
      • Scholarly Publications
      • Faculty of Engineering
      • Department of Mechanical Engineering
      • View Item
      •   BUIR Home
      • Scholarly Publications
      • Faculty of Engineering
      • Department of Mechanical Engineering
      • View Item
      JavaScript is disabled for your browser. Some features of this site may not work without it.

      3D Force field spectroscopy

      Thumbnail
      View / Download
      860.7 Kb
      Author
      Baykara, Mehmet Z.
      Schwarz, U. D.
      Editor
      Morita, S.
      Giessibl, F. J.
      Meyer, E.
      Wiesendanger, R.
      Date
      2015
      Print ISSN
      1434-4904
      Electronic ISSN
      2197-7127
      Publisher
      Springer, Cham
      Volume
      3
      Pages
      9 - 28
      Language
      English
      Type
      Book Chapter
      Item Usage Stats
      186
      views
      125
      downloads
      Book Title
      Noncontact atomic force microscopy
      Series
      NanoScience and Technology;
      Abstract
      With recent advances in instrumentation and experimental methodology, noncontact atomic force microscopy is now being frequently used to measure the atomic-scale interactions acting between a sharp probe tip and surfaces of interest as a function of three spatial dimensions, via the method of three-dimensional atomic force microscopy (3D-AFM). In this chapter, we discuss the different data collection and processing approaches taken towards this goal while highlighting the associated advantages and disadvantages in terms of correct interpretation of results. Additionally, common sources of artifacts in 3D-AFM measurements, including thermal drift, piezo nonlinearities, and tip-related issues such as asymmetry and elasticity are considered. Finally, the combination of 3D-AFM with simultaneous scanning tunneling microscopy (STM) is illustrated on surface-oxidized Cu(100). We conclude the chapter by an outlook regarding the future development of the 3D-AFM method.
      Keywords
      Scanning tunneling microscope
      Drift rate
      Scanning probe microscopy
      Tunneling current
      Highly orient pyrolytic graphite
      Permalink
      http://hdl.handle.net/11693/50865
      Published Version (Please cite this version)
      https://doi.org/10.1007/978-3-319-15588-3_2
      https://doi.org/10.1007/978-3-319-15588-3
      Collections
      • Department of Mechanical Engineering 254
      Show full item record

      Browse

      All of BUIRCommunities & CollectionsTitlesAuthorsAdvisorsBy Issue DateKeywordsTypeDepartmentsThis CollectionTitlesAuthorsAdvisorsBy Issue DateKeywordsTypeDepartments

      My Account

      Login

      Statistics

      View Usage StatisticsView Google Analytics Statistics

      Bilkent University

      If you have trouble accessing this page and need to request an alternate format, contact the site administrator. Phone: (312) 290 1771
      Copyright © Bilkent University - Library IT

      Contact Us | Send Feedback | Off-Campus Access | Admin | Privacy