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dc.contributor.authorErtaş, Gülayen_US
dc.contributor.authorSüzer, Şefiken_US
dc.contributor.editorBlitz, J. P.en_US
dc.contributor.editorGun'ko, V. M.en_US
dc.date.accessioned2019-04-22T06:11:51Z
dc.date.available2019-04-22T06:11:51Z
dc.date.issued2006en_US
dc.identifier.isbn9781402047398
dc.identifier.urihttp://hdl.handle.net/11693/50857
dc.descriptionChapter 5en_US
dc.description.abstractX-ray Photoelectron Spectroscopy, XPS, due to the perfect match of its probe length (1-10 nm) to nanoparticle size, chemical specificity, and susceptibility to electrical charges, is ideally suited for harvesting chemical, physical and electrical information from nanosized surface structures. In addition, by recording XPS spectra while applying external d.c. and/or pulsed voltage stimuli, it is also possible to control the extent of charging and extract various analytical information. In the simplest form, application of a static (d.c.) voltage stimuli enhances separation of otherwise overlapping peaks of gold nanoparticles from that of metallic gold. When the voltage stimuli is applied in the form of rectangular pulses, dynamic information is obtained from the frequency dependence of the charging shifts. This enables us to better probe the composition of nanoparticles produced (i.e. silicide formation, or whether or the extent of reduction, etc.) when platinum salt is deposited on silicon substrates. Finally, by recording the data in different time windows, XPS spectra can be recorded in time-resolved fashion. Time-resolved spectra can be used to detect, locate and quantify the charges developed in various surface structures like gold(core)/ silica(shell) nanoparticles on a copper substrate.en_US
dc.language.isoEnglishen_US
dc.relation.ispartofSurface chemistry in biomedical and environmental scienceen_US
dc.relation.isversionofhttps://doi.org/10.1007/1-4020-4741-X_5en_US
dc.relation.isversionofhttps://doi.org/10.1007/1-4020-4741-Xen_US
dc.subjectXPSen_US
dc.subjectDifferential chargingen_US
dc.subjectPeak separationen_US
dc.subjectTime-resolved XPSen_US
dc.titleAnalysis of surface structures using XPS with external stimulien_US
dc.typeBook Chapteren_US
dc.departmentDepartment of Chemistryen_US
dc.citation.spage45en_US
dc.citation.epage58en_US
dc.identifier.doi10.1007/1-4020-4741-X_5en_US
dc.identifier.doi10.1007/1-4020-4741-Xen_US
dc.publisherSpringer, Dordrechten_US


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