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dc.contributor.authorFardmanesh, Mehdien_US
dc.contributor.editorNarlikar, A. V.
dc.date.accessioned2019-04-19T07:59:10Z
dc.date.available2019-04-19T07:59:10Z
dc.date.issued2004en_US
dc.identifier.isbn9783642073694
dc.identifier.urihttp://hdl.handle.net/11693/50842
dc.description.abstractOne of the promising devices made of high temperature superconducting (HTSC) materials are edge transition bolometers. Since the discovery of high-temperature superconductors, many works have been focused on the application of these materials in different types of bolometers for the near to far infrared wavelength regime [l]-[9]. They can be used to detect electromagnetic radiation over the whole spectrum from x-ray to the far-infrared [1], [9]-[13]. The superconductor bolometers typically consist of patterned thin or thick superconducting films deposited on crystalline substrates such as MgO, SrTiO3, and LaA103. Their operation is based upon their steep drop in the resistance, R, at their transition temperature, Tc. The detector is typically held at a temperature close to the middle of the superconducting transition, where the dR/dT is maximum. When the detector is illuminated its temperature rises by an amount proportional to the input radiation power resulting in a ΔR. The response obtained by the above mechanism is the so called the bolometric, or equilibrium response, as opposed to typically faster non-bolometric or intrinsic response caused by other mechanisms such as direct depairing. A typical response of an YBCO sample versus temperature at low frequencies is shown in Figure 1.1.en_US
dc.language.isoEnglishen_US
dc.relation.ispartofHigh temperature superconductivity 2en_US
dc.relation.isversionofhttps://doi.org/10.1007/978-3-662-07764-1_15en_US
dc.relation.isversionofhttps://doi.org/10.1007/978-3-662-07764-1en_US
dc.subjectModulation frequencyen_US
dc.subjectSubstrate materialen_US
dc.subjectJoule heatingen_US
dc.subjectBias currenten_US
dc.subjectYBCO filmen_US
dc.titleResponse analysis and modeling of high temperature superconductor edge transition bolometersen_US
dc.typeBook Chapteren_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage477en_US
dc.citation.epage535en_US
dc.identifier.doi10.1007/978-3-662-07764-1_15en_US
dc.identifier.doi10.1007/978-3-662-07764-1en_US
dc.publisherSpringeren_US
dc.identifier.eisbn9783662077641


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