NS-SRAM: neighborhood solidarity SRAM for reliability enhancement of SRAM memories
Date
2016-08-09Source Title
2016 Euromicro Conference on Digital System Design (DSD)
Publisher
IEEE
Pages
154 - 159
Language
English
Type
Conference PaperItem Usage Stats
245
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219
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Abstract
Technology shift and voltage scaling increased the susceptibility of Static Random Access Memories (SRAMs) to errors dramatically. In this paper, we present NS-SRAM, for Neighborhood Solidarity SRAM, a new technique to enhance error resilience of SRAMs by exploiting the adjacent memory bit data. Bit cells of a memory line are paired together in circuit level to mutually increase the static noise margin and critical charge of a cell. Unlike existing techniques, NS-SRAM aims to enhance both Bit Error Rate (BER) and Soft Error rate (SER) at the same time. Due to auto-adaptive joiners, each of the adjacent cells' nodes is connected to its counterpart in the neighbor bit. NS-SRAM enhances read-stability by increasing critical Read Static Noise Margin (RSNM), thereby decreasing faults when circuit operates under voltage scaling. It also increases hold-stability and critical charge to mitigate soft-errors. By the proposed technique, reliability of SRAM based structures such as cache memories and register files can drastically be improved with comparable area overhead to existing hardening techniques. Moreover it does not require any extra-memory, does not impact the memory effective size, and has no negative impact on performance. © 2016 IEEE.
Keywords
ReliabilitySNM
Soft errors
SRAM
Bit error rate
Cache memory
Computer control
Digital storage
Error correction
Errors
Radiation hardening
Random access storage
Random errors
Reliability
Systems analysis
Voltage scaling
Error resilience
Read static noise margin (RSNM)
Reliability enhancement
Soft error
Soft error rate
Static noise margin
Static random access memory
Technology shift
Static random access storage
Permalink
http://hdl.handle.net/11693/37753Published Version (Please cite this version)
http://dx.doi.org/10.1109/DSD.2016.12Collections
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