• About
  • Policies
  • What is open access
  • Library
  • Contact
Advanced search
      View Item 
      •   BUIR Home
      • Scholarly Publications
      • Institute of Materials Science and Nanotechnology (UNAM)
      • View Item
      •   BUIR Home
      • Scholarly Publications
      • Institute of Materials Science and Nanotechnology (UNAM)
      • View Item
      JavaScript is disabled for your browser. Some features of this site may not work without it.

      Perfectly absorbing ultra thin interference coatings for hydrogen sensing

      Thumbnail
      View / Download
      1.5 Mb
      Author(s)
      Serhatlioglu, M.
      Ayas S.
      Bıyıklı, Necmi
      Dana, A.
      Solmaz, M. E.
      Date
      2016
      Source Title
      Optics Letters
      Print ISSN
      0146-9592
      Publisher
      OSA - The Optical Society
      Volume
      41
      Issue
      8
      Pages
      1724 - 1727
      Language
      English
      Type
      Article
      Item Usage Stats
      196
      views
      269
      downloads
      Abstract
      Here we numerically demonstrate a straightforward method for optical detection of hydrogen gas by means of absorption reduction and colorimetric indication. A perfectly absorbing metal-insulator-metal (MIM) thin film interference structure is constructed using a silver metal back reflector, silicon dioxide insulator, and palladium as the upper metal layer and hydrogen catalyst. The thickness of silicon dioxide allows the maximizing of the electric field intensity at the Air/SiO2 interface at the quarter wavelengths and enabling perfect absorption with the help of highly absorptive palladium thin film (∼7 nm). While the exposure of the MIM structure to H2 moderately increases reflection, the relative intensity contrast due to formation of metal hydride is extensive. By modifying the insulator film thickness and hence the spectral absorption, the color is tuned and eye-visible results are obtained.
      Keywords
      Electric fields
      Film thickness
      Hydrides
      Interfaces (materials)
      Metal insulator boundaries
      Metals
      Palladium
      Phase interfaces
      Silica
      Silver
      Thin films
      Electric field intensities
      Hydrogen catalysts
      Interference coatings
      Metal insulator metals
      Quarter-wavelength
      Spectral absorptions
      Straight-forward method
      Thin-film interference
      MIM devices
      Permalink
      http://hdl.handle.net/11693/36842
      Published Version (Please cite this version)
      https://doi.org/10.1364/OL.41.001724
      Collections
      • Institute of Materials Science and Nanotechnology (UNAM) 2260
      Show full item record

      Browse

      All of BUIRCommunities & CollectionsTitlesAuthorsAdvisorsBy Issue DateKeywordsTypeDepartmentsCoursesThis CollectionTitlesAuthorsAdvisorsBy Issue DateKeywordsTypeDepartmentsCourses

      My Account

      Login

      Statistics

      View Usage StatisticsView Google Analytics Statistics

      Bilkent University

      If you have trouble accessing this page and need to request an alternate format, contact the User and Access Services. Phone: (312) 290 1298
      © Bilkent University - Library IT

      Contact Us | Send Feedback | Off-Campus Access | Admin | Privacy