Perfectly absorbing ultra thin interference coatings for hydrogen sensing
Date
2016Source Title
Optics Letters
Print ISSN
0146-9592
Publisher
OSA - The Optical Society
Volume
41
Issue
8
Pages
1724 - 1727
Language
English
Type
ArticleItem Usage Stats
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Abstract
Here we numerically demonstrate a straightforward method for optical detection of hydrogen gas by means of absorption reduction and colorimetric indication. A perfectly absorbing metal-insulator-metal (MIM) thin film interference structure is constructed using a silver metal back reflector, silicon dioxide insulator, and palladium as the upper metal layer and hydrogen catalyst. The thickness of silicon dioxide allows the maximizing of the electric field intensity at the Air/SiO2 interface at the quarter wavelengths and enabling perfect absorption with the help of highly absorptive palladium thin film (∼7 nm). While the exposure of the MIM structure to H2 moderately increases reflection, the relative intensity contrast due to formation of metal hydride is extensive. By modifying the insulator film thickness and hence the spectral absorption, the color is tuned and eye-visible results are obtained.
Keywords
Electric fieldsFilm thickness
Hydrides
Interfaces (materials)
Metal insulator boundaries
Metals
Palladium
Phase interfaces
Silica
Silver
Thin films
Electric field intensities
Hydrogen catalysts
Interference coatings
Metal insulator metals
Quarter-wavelength
Spectral absorptions
Straight-forward method
Thin-film interference
MIM devices