Nanoscale tribology of graphene grown by chemical vapor deposition and transferred onto silicon oxide substrates
Baykara, M. Z.
Journal of Materials Research
Cambridge University Press
1914 - 1923
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We present a comprehensive nanoscale tribological characterization of single-layer graphene grown by chemical vapor deposition (CVD) and transferred onto silicon oxide (SiO2) substrates. Specifically, the nanotribological properties of graphene samples are studied via atomic force microscopy (AFM) under ambient conditions using calibrated probes, by measuring the evolution of friction force with increasing normal load. The effect of using different probes and post-transfer cleaning procedures on frictional behavior is evaluated. A new method of quantifying lubrication performance based on measured friction coefficient ratios of graphene and SiO2 is introduced. A comparison of lubrication properties with mechanically-exfoliated graphene is performed. Results indicate that CVD-grown graphene constitutes a very good solid lubricant on SiO2, reducing friction coefficients by ∼ 90% for all investigated samples. Finally, the effect of wrinkles associated with CVD-grown graphene on measured friction values is quantitatively analyzed, with results revealing a substantial increase in friction on these structural defects.
KeywordsAtomic force microscopy
Chemical vapor depositions (CVD)
Silicon oxide substrates
Chemical vapor deposition
Published Version (Please cite this version)http://dx.doi.org/10.1557/jmr.2016.11
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