dc.contributor.advisor | Fardmanesh, Mehdi | |
dc.contributor.author | Yılmaz, Abdulvahit | |
dc.date.accessioned | 2016-07-01T11:01:20Z | |
dc.date.available | 2016-07-01T11:01:20Z | |
dc.date.issued | 2004 | |
dc.identifier.uri | http://hdl.handle.net/11693/29555 | |
dc.description | Cataloged from PDF version of article. | en_US |
dc.description.abstract | Since the discovery of high temperature superconductors, superconductivity
became one of the fast emerging technologies being used in numerous
applications where in many of these applications Josephson junctions form the
basis for superconducting electronic devices and circuits. In order to use the
Josephson junctions effectively and fabricate them reproducibly with the same
properties, their characterization should be done where their main characterization
is the current vs. voltage measurement. This study concentrates on the design and
implementation of two automated low noise cryogenic characterization systems
that let current vs. voltage, dynamic resistance vs. current, and resistance vs.
temperature characterizations be done at temperatures ranging from 63.15K to
120K for the Josephson junctions. In this study, also the fabrication and
preparation steps of different types of high-Tc Josephson junctions, such as step
edge and bicrystal junctions of junction arrays, gradiometers’, and dc-SQUIDs’
for characterization, are explained. By using the established characterization
systems, the current vs. voltage behaviors for different types of junctions could be
measured and classified. | en_US |
dc.description.statementofresponsibility | Yılmaz, Abdulvahit | en_US |
dc.format.extent | xi, 71 leaves | en_US |
dc.language.iso | English | en_US |
dc.rights | info:eu-repo/semantics/openAccess | en_US |
dc.subject | Superconductor | en_US |
dc.subject | cryogenic system | en_US |
dc.subject | I-V characterization | en_US |
dc.subject | Josephson junction | en_US |
dc.subject.lcc | QC176.8.T8 Y55 2004 | en_US |
dc.subject.lcsh | Josephson effect. | en_US |
dc.title | Design and implementation of an automated low noise cryogenic characterization system for high-Tc Josephson junctions | en_US |
dc.type | Thesis | en_US |
dc.department | Department of Electrical and Electronics Engineering | en_US |
dc.publisher | Bilkent University | en_US |
dc.description.degree | M.S. | en_US |
dc.identifier.itemid | BILKUTUPB084034 | |