dc.contributor.advisor | Aydınlı, Atilla | |
dc.contributor.author | Kocabaş, Coşkun | |
dc.date.accessioned | 2016-07-01T10:58:02Z | |
dc.date.available | 2016-07-01T10:58:02Z | |
dc.date.issued | 2003 | |
dc.identifier.uri | http://hdl.handle.net/11693/29334 | |
dc.description | Cataloged from PDF version of article. | en_US |
dc.description.abstract | In this thesis, we have studied the use of integrated optical waveguide devices
acting as integrated displacement sensors on cantilevers for scanning probe
microscopes. These displacement sensors include integrated optical waveguide
devices such as Bragg gratings, ring resonators, race track resonators and
waveguide Michelson interferometers fabricated on a cantilever to measure the
displacement of the cantilever tip due to the forces between surface and the
tip. The displacement of the cantilever tip is measured directly from the change
of the transmission characteristics of the optical device. As the cantilever tip
displaces, the stress on the cantilever surface changes the refractive index of the
materials that make up the integrated optical device which cause variations in its
optical transmission characteristics. We have also studied an optical waveguide
grating coupler fabricated on the cantilever for the same purpose. In two different
embodiments of this device, light is either coupled in or out of the waveguide
via the waveguide grating coupler. The displacement of the cantilever alters
the direction of the scattered light and measuring the power of the scattered
light with a position sensitive detector allows for the detection of cantilever
i
tip displacement. The novel design proposed in this work provides very high
displacement sensitivity of the order of 10−4˚A−1
. | en_US |
dc.description.statementofresponsibility | Kocabaş, Coşkun | en_US |
dc.format.extent | xiii, 89 leaves, illustrations, tables, graphs, 30 cm | en_US |
dc.language.iso | English | en_US |
dc.rights | info:eu-repo/semantics/openAccess | en_US |
dc.subject | Scanning Probe Microscopy | en_US |
dc.subject | Scanning Force Microscopy | en_US |
dc.subject | MachZehnder
interferometer | en_US |
dc.subject | Ring resonator | en_US |
dc.subject | Grating coupler | en_US |
dc.subject | Displacement sensor | en_US |
dc.subject | Integrated optics | en_US |
dc.subject | Waveguide sensors | en_US |
dc.subject.lcc | QH212.S33 K63 2003 | en_US |
dc.subject.lcsh | Scanning probe microscopy. | en_US |
dc.title | Integrated optical displacement sensors for scanning force microscopies | en_US |
dc.type | Thesis | en_US |
dc.department | Department of Physics | en_US |
dc.publisher | Bilkent University | en_US |
dc.description.degree | M.S. | en_US |
dc.identifier.itemid | BILKUTUPB034436 | |