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dc.contributor.authorAkbaş, Cem Emreen_US
dc.contributor.authorBozkurt, Alicanen_US
dc.contributor.authorArslan, Musa Tunçen_US
dc.contributor.authorAslanoğlu, Hüseyinen_US
dc.contributor.authorÇetin, A. Enisen_US
dc.coverage.spatialParis, France
dc.date.accessioned2016-02-08T12:26:52Z
dc.date.available2016-02-08T12:26:52Z
dc.date.issued2014-11en_US
dc.identifier.urihttp://hdl.handle.net/11693/28674
dc.descriptionDate of Conference: 1-2 Nov. 2014
dc.descriptionConference name: International Workshop on Computational Intelligence for Multimedia Understanding, IWCIM 2014
dc.description.abstractThe cosine similarity measure is widely used in big data analysis to compare vectors. In this article a new set of vector similarity measures are proposed. New vector similarity measures are based on a multiplication-free operator which requires only additions and sign operations. A vector 'product' using the multiplication-free operator is also defined. The new vector product induces the ℓ1-norm. As a result, new cosine measure-like similarity measures are normalized by the ℓ1-norms of the vectors. They can be computed using the MapReduce framework. Simulation examples are presented. © 2014 IEEE.en_US
dc.language.isoEnglishen_US
dc.source.titleInternational Workshop on Computational Intelligence for Multimedia Understanding, IWCIM 2014en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/IWCIM.2014.7008798en_US
dc.subjectBig dataen_US
dc.subjectCosine similarityen_US
dc.subjectMapReduceen_US
dc.subjectMultiplication-free operatoren_US
dc.subjectArtificial intelligenceen_US
dc.subjectData handlingen_US
dc.subjectInformation analysisen_US
dc.subjectVectorsen_US
dc.subjectCosine similarity measuresen_US
dc.subjectMap-reduceen_US
dc.subjectMapreduce frameworksen_US
dc.subjectSimilarity measureen_US
dc.subjectSimulation exampleen_US
dc.subjectVector similarityen_US
dc.subjectBig dataen_US
dc.titleL1 norm based multiplication-free cosine similarity measures for big data analysisen_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage[1]
dc.citation.epage[5]
dc.identifier.doi10.1109/IWCIM.2014.7008798en_US
dc.publisherIEEEen_US
dc.contributor.bilkentauthorÇetin, A. Enis


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