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      Effects of additional independent noise in binary composite hypothesis-testing problems

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      Author(s)
      Bayram, Suat
      Gezici, Sinan
      Date
      2009-09
      Source Title
      3rd International Conference on Signal Processing and Communication Systems, ICSPCS'2009 - Proceedings
      Publisher
      IEEE
      Pages
      1 - 9
      Language
      English
      Type
      Conference Paper
      Item Usage Stats
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      Abstract
      Performance of some suboptimal detectors can be improved by adding independent noise to their observations. In this paper, the effects of adding independent noise to observations of a detector are investigated for binary composite hypothesistesting problems in a generalized Neyman-Pearson framework. Sufficient conditions are derived to determine when performance of a detector can or cannot be improved via additional independent noise. Also, upper and lower limits are derived on the performance of a detector in the presence of additional noise, and statistical characterization of optimal additional noise is provided. In addition, two optimization techniques are proposed to calculate the optimal additional noise. Finally, simulation results are presented to investigate the theoretical results. © 2009 IEEE.
      Keywords
      Binary hypothesis-testing
      Composite hypothesis-testing
      Neyman-pearson
      Stochastic resonance
      Binary composites
      Binary hypothesis-testing
      Composite hypothesis
      Composite hypothesis-testing
      Generalized neyman-pearson
      Independent noise
      Lower limits
      Optimization techniques
      Simulation result
      Statistical characterization
      Stochastic resonances
      Sufficient conditions
      Theoretical result
      Circuit resonance
      Communication systems
      Magnetic resonance
      Optimization
      Signal processing
      Stochastic systems
      Detectors
      Permalink
      http://hdl.handle.net/11693/28619
      Published Version (Please cite this version)
      http://dx.doi.org/10.1109/ICSPCS.2009.5306435
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      • Department of Electrical and Electronics Engineering 3702
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