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dc.contributor.authorBayram, S.en_US
dc.contributor.authorGezici, S.en_US
dc.date.accessioned2016-02-08T12:25:15Z
dc.date.available2016-02-08T12:25:15Z
dc.date.issued2009en_US
dc.identifier.urihttp://hdl.handle.net/11693/28617
dc.description.abstractIn this study, the effects of adding independent noise to observations of a suboptimal detector are studied for M-ary hypothesis-testing problems according to the minimax criterion. It is shown that the optimal additional noise can be represented by a randomization of at most M signal values under certain conditions. In addition, a convex relaxation approach is proposed to obtain an accurate approximation to the noise probability distribution in polynomial time. Furthermore, sufficient conditions are presented to determine when additional noise can or cannot improve the performance of a given detector. Finally, a numerical example is presented. © 2009 IEEE.en_US
dc.language.isoEnglishen_US
dc.source.title3rd International Conference on Signal Processing and Communication Systems, ICSPCS'2009 - Proceedingsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/ICSPCS.2009.5306400en_US
dc.subjectDetectionen_US
dc.subjectHypothesis-testingen_US
dc.subjectMinimaxen_US
dc.subjectNoise-enhanced detectionen_US
dc.subjectStochastic resonanceen_US
dc.subjectConvex relaxationen_US
dc.subjectIndependent noiseen_US
dc.subjectMinimaxen_US
dc.subjectMinimax criterionen_US
dc.subjectNoise-enhanced detectionen_US
dc.subjectNumerical exampleen_US
dc.subjectPolynomial-timeen_US
dc.subjectSignal valueen_US
dc.subjectStochastic resonancesen_US
dc.subjectSufficient conditionsen_US
dc.subjectCircuit resonanceen_US
dc.subjectCommunication systemsen_US
dc.subjectDetectorsen_US
dc.subjectMagnetic resonanceen_US
dc.subjectPolynomial approximationen_US
dc.subjectProbability distributionsen_US
dc.subjectRelaxation processesen_US
dc.subjectSignal processingen_US
dc.subjectStochastic systemsen_US
dc.subjectSignal detectionen_US
dc.titleNoise-enhanced M-ary hypothesis-testing in the minimax frameworken_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineering
dc.identifier.doi10.1109/ICSPCS.2009.5306400en_US


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