On-chip integrated nanowire devices with controllable nanogap for manipulation, capturing, and electrical characterization of nanoparticles
Date
2009
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Source Title
2009 IEEE LEOS Annual Meeting Conference Proceedings
Print ISSN
1092-8081
Electronic ISSN
Publisher
IEEE
Volume
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Pages
217 - 218
Language
English
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Abstract
Dielectrophoresis (DEP) allows for electric field assisted assembly in spatially non-uniform field distribution, where the induced moment is translated into a net force on polarized particles towards the high field gradient. For example, for a spherical particle of radius r with a permittivity constant ofεp in a host medium with the permittivity ofε m, the dielectrophoretic force is given by (1): where r is the particle radius, ω is the angular frequency and Erms is the root mean square electric field. K is the Clausius-Mossotti function, which depends on the complex permittivity of the spherical particle and the medium [1].IEEE.
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Keywords
Angular frequencies , Complex permittivity , Dielectrophoresis , Dielectrophoretic forces , Electrical characterization , High field , Host mediums , Nano-gap , Nanowire devices , Nonuniform field , On chips , Permittivity constant , Polarized particles , Root Mean square , Spherical particle , Dielectric devices , Electric fields , Electrophoresis , Permittivity