Charging/discharging dynamics of CdS and CdSe films under photoillumination using dynamic x-ray photoelectron spectroscopy
Author
Sezen, H.
Suzer, S.
Date
2010Source Title
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Print ISSN
0734-2101
Electronic ISSN
1944-2807
Publisher
A I P Publishing LLC
Volume
28
Issue
4
Pages
639 - 642
Language
English
Type
ArticleItem Usage Stats
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Show full item recordAbstract
Thin films of CdS and CdSe are deposited on HF-cleaned Si O2 /Si substrates containing ∼5 nm thermally grown silicon oxide. x-ray photoelectron spectroscopy (XPS) data of these films are collected in a dynamic mode, which is based on recording the spectrum under modulation with an electrical signal in the form of ±10 V square-wave pulses. Accordingly, all peaks are twined and shifted with respect to the grounded spectrum. The binding energy difference between the twinned peaks of a dielectric system has a strong dependence on the frequency of the electrical stimuli. Therefore, dynamic XPS provides a means to extract additional properties of dielectric materials, such as effective resistance and capacitance. In this work, the authors report a new advancement to the previous method, where they now probe a photodynamic process. For this reason, photoillumination is introduced as an additional form of stimulus and used to investigate the combined optical and electrical response of the photoconductive thin films of CdS and CdSe using dynamic XPS.
Keywords
CdSCdSe films
Charging/discharging
Dielectric systems
Dynamic modes
Electrical response
Electrical signal
Electrical stimuli
Photodynamic process
Photoillumination
Si substrates
Square-wave
XPS
Binding energy
Cadmium alloys
Cadmium compounds
Cadmium sulfide
Data storage equipment
Dielectric materials
Dynamic response
Materials properties
Photoelectricity
Photoionization
Photons
Silicon compounds
Silicon oxides
Thin films
X ray photoelectron spectroscopy