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      Charging/discharging dynamics of CdS and CdSe films under photoillumination using dynamic x-ray photoelectron spectroscopy

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      Author
      Sezen, H.
      Suzer, S.
      Date
      2010
      Source Title
      Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
      Print ISSN
      0734-2101
      Electronic ISSN
      1944-2807
      Publisher
      A I P Publishing LLC
      Volume
      28
      Issue
      4
      Pages
      639 - 642
      Language
      English
      Type
      Article
      Item Usage Stats
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      Abstract
      Thin films of CdS and CdSe are deposited on HF-cleaned Si O2 /Si substrates containing ∼5 nm thermally grown silicon oxide. x-ray photoelectron spectroscopy (XPS) data of these films are collected in a dynamic mode, which is based on recording the spectrum under modulation with an electrical signal in the form of ±10 V square-wave pulses. Accordingly, all peaks are twined and shifted with respect to the grounded spectrum. The binding energy difference between the twinned peaks of a dielectric system has a strong dependence on the frequency of the electrical stimuli. Therefore, dynamic XPS provides a means to extract additional properties of dielectric materials, such as effective resistance and capacitance. In this work, the authors report a new advancement to the previous method, where they now probe a photodynamic process. For this reason, photoillumination is introduced as an additional form of stimulus and used to investigate the combined optical and electrical response of the photoconductive thin films of CdS and CdSe using dynamic XPS.
      Keywords
      CdS
      CdSe films
      Charging/discharging
      Dielectric systems
      Dynamic modes
      Electrical response
      Electrical signal
      Electrical stimuli
      Photodynamic process
      Photoillumination
      Si substrates
      Square-wave
      XPS
      Binding energy
      Cadmium alloys
      Cadmium compounds
      Cadmium sulfide
      Data storage equipment
      Dielectric materials
      Dynamic response
      Materials properties
      Photoelectricity
      Photoionization
      Photons
      Silicon compounds
      Silicon oxides
      Thin films
      X ray photoelectron spectroscopy
      Permalink
      http://hdl.handle.net/11693/28576
      Published Version (Please cite this version)
      http://dx.doi.org/10.1116/1.3289319
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