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dc.contributor.authorErden F.en_US
dc.contributor.authorSoyer, E.B.en_US
dc.contributor.authorToreyin, B.U.en_US
dc.contributor.authorÇetin, A.E.en_US
dc.date.accessioned2016-02-08T12:23:06Z
dc.date.available2016-02-08T12:23:06Z
dc.date.issued2010en_US
dc.identifier.issn15206149
dc.identifier.urihttp://hdl.handle.net/11693/28532
dc.description.abstractIn this paper, we propose a novel method for detecting and monitoring Volatile Organic Compounds (VOC) gas leaks by using a Pyro-electric (or Passive) Infrared (PIR) sensor whose spectral range intersects with the absorption bands of VOC gases. A continuous time analog signal is obtained from the PIR sensor. This signal is discretized and analyzed in real time. Feature parameters are extracted in wavelet domain and classified using a Markov Model (MM) based classifier. Experimental results are presented. ©2010 IEEE.en_US
dc.language.isoEnglishen_US
dc.source.titleICASSP, IEEE International Conference on Acoustics, Speech and Signal Processing - Proceedingsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/ICASSP.2010.5495500en_US
dc.subjectMarkov modelsen_US
dc.subjectPyro-electric infrared (PIR) sensoren_US
dc.subjectVoc gas leak detectionen_US
dc.subjectWavelet transformen_US
dc.subjectAbsorption banden_US
dc.subjectAnalog signalsen_US
dc.subjectContinuous timeen_US
dc.subjectFeature parametersen_US
dc.subjectGas leak detectionen_US
dc.subjectGas leaksen_US
dc.subjectInfra-red sensoren_US
dc.subjectMarkov modelen_US
dc.subjectNovel methodsen_US
dc.subjectPyro-electric infrared (PIR) sensoren_US
dc.subjectReal timeen_US
dc.subjectSpectral rangeen_US
dc.subjectVoc gas leak detectionen_US
dc.subjectWavelet domainen_US
dc.subjectGas absorptionen_US
dc.subjectGasesen_US
dc.subjectLeak detectionen_US
dc.subjectMarkov processesen_US
dc.subjectSignal detectionen_US
dc.subjectSignal processingen_US
dc.subjectVolatile organic compoundsen_US
dc.subjectWavelet transformsen_US
dc.subjectSensorsen_US
dc.titleVOC gas leak detection using pyro-electric infrared sensorsen_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineering
dc.citation.spage1682en_US
dc.citation.epage1685en_US
dc.identifier.doi10.1109/ICASSP.2010.5495500en_US


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