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dc.contributor.authorKale, A.en_US
dc.contributor.authorAksoy, S.en_US
dc.date.accessioned2016-02-08T12:22:39Z
dc.date.available2016-02-08T12:22:39Z
dc.date.issued2010en_US
dc.identifier.issn10514651
dc.identifier.urihttp://hdl.handle.net/11693/28514
dc.description.abstractThe key step of a computer-assisted screening system that aims early diagnosis of cervical cancer is the accurate segmentation of cells. In this paper, we propose a two-phase approach to cell segmentation in Pap smear test images with the challenges of inconsistent staining, poor contrast, and overlapping cells. The first phase consists of segmenting an image by a non-parametric hierarchical segmentation algorithm that uses spectral and shape information as well as the gradient information. The second phase aims to obtain nucleus regions and cytoplasm areas by classifying the segments resulting from the first phase based on their spectral and shape features. Experiments using two data sets show that our method performs well for images containing both a single cell and many overlapping cells. © 2010 IEEE.en_US
dc.language.isoEnglishen_US
dc.source.titleProceedings - International Conference on Pattern Recognitionen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/ICPR.2010.587en_US
dc.subjectCell segmentationen_US
dc.subjectCervical cancersen_US
dc.subjectCervical cellsen_US
dc.subjectComputer assisteden_US
dc.subjectData setsen_US
dc.subjectEarly diagnosisen_US
dc.subjectGradient informationsen_US
dc.subjectHierarchical segmentationen_US
dc.subjectNon-parametricen_US
dc.subjectOverlapping cellsen_US
dc.subjectPap smearen_US
dc.subjectPhase baseden_US
dc.subjectScreening systemen_US
dc.subjectSecond phaseen_US
dc.subjectShape featuresen_US
dc.subjectShape informationen_US
dc.subjectSingle cellsen_US
dc.subjectTest imagesen_US
dc.subjectCytologyen_US
dc.subjectDiagnosisen_US
dc.subjectPattern recognitionen_US
dc.subjectImage segmentationen_US
dc.titleSegmentation of cervical cell imagesen_US
dc.typeConference Paperen_US
dc.departmentDepartment of Computer Engineering
dc.citation.spage2399en_US
dc.citation.epage2402en_US
dc.identifier.doi10.1109/ICPR.2010.587en_US


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