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dc.contributor.authorSukharevsky, I.en_US
dc.contributor.authorAltintas, Ayhanen_US
dc.coverage.spatialKyiv, Ukraine
dc.date.accessioned2016-02-08T12:22:26Z
dc.date.available2016-02-08T12:22:26Z
dc.date.issued2010-09en_US
dc.identifier.urihttp://hdl.handle.net/11693/28504
dc.descriptionDate of Conference: 6-8 Sept. 2010
dc.descriptionConference name: 2010 International Conference on Mathematical Methods in Electromagnetic Theory
dc.description.abstractThe exact mathematical model of an aperture antenna and the image theory are used to develop exact and PO integral representations of the fields radiated by radome-enclosed aperture antenna. The desired problem is reduced to finding fields of a plane wave diffracted on the "symmetrized" radome. The passage of the wave through the wall of the radome is analysed by means of geometrical optics. Caustic influence is taken into account, and the contribution of stationary phase points of reflected field to the far-side radiation is discussed. Radiation patterns for antennas with a specified ampliphase distribution enclosed in spherical and parabolic radomes are analysed. © 2010 IEEE.en_US
dc.language.isoEnglishen_US
dc.source.titleMathematical Methods in Electromagnetic Theory, MMET, Conference Proceedingsen_US
dc.relation.isversionofhttps://doi.org/10.1109/MMET.2010.5611406en_US
dc.subjectA-planeen_US
dc.subjectAperture antennasen_US
dc.subjectImage theoryen_US
dc.subjectIntegral representationen_US
dc.subjectRadiation patternsen_US
dc.subjectReflected fieldsen_US
dc.subjectStationary phase pointen_US
dc.subjectThrough the wallen_US
dc.subjectDirectional patterns (antenna)en_US
dc.subjectElectric fieldsen_US
dc.subjectElectromagnetismen_US
dc.subjectMathematical modelsen_US
dc.subjectParabolic antennasen_US
dc.subjectRadomesen_US
dc.titleCalculation of radome-enclosed aperture antenna in 3-Den_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineeringen_US
dc.citation.spage[1]
dc.citation.epage[4]
dc.identifier.doi10.1109/MMET.2010.5611406en_US
dc.publisherIEEE


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