Show simple item record

dc.contributor.authorBilici, T.en_US
dc.contributor.authorTabakoğlu, O.en_US
dc.contributor.authorKalaycıoğlu, Hamiten_US
dc.contributor.authorKurt, A.en_US
dc.contributor.authorSennaroglu, A.en_US
dc.contributor.authorGülsoy, M.en_US
dc.coverage.spatialBuenos Aires, Argentinaen_US
dc.date.accessioned2016-02-08T12:21:54Z
dc.date.available2016-02-08T12:21:54Z
dc.date.issued2010en_US
dc.identifier.urihttp://hdl.handle.net/11693/28486
dc.descriptionDate of Conference: 31 Aug.-4 Sept. 2010en_US
dc.description.abstractTm:YAP laser system at power levels up to 1.2 W at 1980 nm was established in both continuous-wave and modulated modes of operation. The fluence effect of the laser system for skin ablation was analyzed by histology analysis with Wistar rat skin tissues. Thermally altered length, thermally altered area, ablation area, and ablation depth parameters were measured on histology images of skin samples just after the laser operation and after four-day healing period. Continuous-wave mode of operation provided higher thermal effects on the skin samples. Lower fluence levels were found for efficient ablation effect. © 2010 IEEE.en_US
dc.language.isoEnglishen_US
dc.source.title2010 Annual International Conference of the IEEE Engineering in Medicine and Biologyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/IEMBS.2010.5627205en_US
dc.subjectAblation areaen_US
dc.subjectAblation depthen_US
dc.subjectContinuous wave modesen_US
dc.subjectContinuous wavesen_US
dc.subjectFluencesen_US
dc.subjectHistology imagesen_US
dc.subjectLaser operationsen_US
dc.subjectLaser systemsen_US
dc.subjectModes of operationen_US
dc.subjectPower levelsen_US
dc.subjectSkin ablationen_US
dc.subjectSkin samplesen_US
dc.subjectThulium laseren_US
dc.subjectTm:YAP lasersen_US
dc.subjectWistar raten_US
dc.subjectHistologyen_US
dc.subjectThuliumen_US
dc.subjectAblationen_US
dc.titleFluence of thulium laser system in skin ablationen_US
dc.typeConference Paperen_US
dc.departmentInstitute of Materials Science and Nanotechnology (UNAM)en_US
dc.citation.spage3218en_US
dc.citation.epage3221en_US
dc.identifier.doi10.1109/IEMBS.2010.5627205en_US
dc.publisherIEEEen_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record