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dc.contributor.authorGöken, Çağrıen_US
dc.contributor.authorGezici, Sinanen_US
dc.contributor.authorArıkan, Orhanen_US
dc.coverage.spatialMarrakech, Moroccoen_US
dc.date.accessioned2016-02-08T12:20:52Z
dc.date.available2016-02-08T12:20:52Z
dc.date.issued2010en_US
dc.identifier.urihttp://hdl.handle.net/11693/28445
dc.descriptionDate of Conference: 20-23 June 2010en_US
dc.description.abstractStochastic signaling is investigated under second and fourth moment constraints for the detection of scalar-valued binary signals in additive noise channels. Sufficient conditions are derived to determine when the use of stochastic signals instead of deterministic ones can or cannot enhance the error performance of a given binary communications system. Also, a convex relaxation approach is employed to obtain approximate solutions of the optimal stochastic signaling problem. Finally, numerical examples are presented, and extensions of the results to M-ary communications systems and to other criteria than the average probability of error are discussed.en_US
dc.language.isoEnglishen_US
dc.source.title2010 IEEE 11th International Workshop on Signal Processing Advances in Wireless Communications (SPAWC)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/SPAWC.2010.5671070en_US
dc.subjectAverage probability of erroren_US
dc.subjectBinary signalsen_US
dc.subjectCommunications systemsen_US
dc.subjectConvex relaxationen_US
dc.subjectError performanceen_US
dc.subjectMoment constraintsen_US
dc.subjectNumerical exampleen_US
dc.subjectProbability of erroren_US
dc.subjectStochastic signalingen_US
dc.subjectStochastic signalsen_US
dc.subjectSufficient conditionsen_US
dc.subjectAdditive noiseen_US
dc.subjectOptimizationen_US
dc.subjectProbabilityen_US
dc.subjectRelaxation processesen_US
dc.subjectSignal processingen_US
dc.subjectSignalingen_US
dc.subjectStochastic systemsen_US
dc.subjectWireless telecommunication systemsen_US
dc.titleStochastic signaling under second and fourth moment constraintsen_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineering
dc.identifier.doi10.1109/SPAWC.2010.5671070en_US
dc.publisherIEEEen_US


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