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      • Faculty of Engineering
      • Department of Electrical and Electronics Engineering
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      Determining F2 layer parameters via optimization using IRI model and IONOLAB TEC estimations

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      Author
      Şahin, O.
      Sezen, U.
      Arıkan, F.
      Arıkan, Orhan
      Date
      2011
      Source Title
      Proceedings of the 19th Signal Processing and Communications Applications Conference, SIU 2011
      Publisher
      IEEE
      Pages
      630 - 633
      Language
      Turkish
      Type
      Conference Paper
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      Abstract
      We know that F2 layer of the ionosphere is most important layer in the progaration of high frequency (HF) waves. In this study, The relation of the height (HmF2) and the critical frequency (FoF2) of F2 layer-among the parameters of the Internation Reference Ionesphere (IRI) model-to the Total Electron Content (TEC) structure of ionosphere is investigated within their defined parametric range. These two parameters are then optimized using IONOLAB TEC estimations. Performance of the optimization algorithm is examined seperately for the cases of processing daily (24-hour) and hourly TEC data. It is observed that using hourly data produce results with much smaller errors. By using this optimization method, the height and the critical frequency of F2 layer are obtained for countries located on low and high latitudes including Turkey for the same quite day. Results are compared with ionosonde data and it is observed that error norms were in an acceptable range. By this way it is attained the more realistic electrical structure of ionosphere.
      Keywords
      Critical frequencies
      Electrical structures
      Error norm
      F2 layer
      High frequency
      High latitudes
      Ionosonde data
      Optimization algorithms
      Optimization method
      Total electron content
      Two parameter
      Frequency estimation
      Ionosphere
      Ionospheric measurement
      Signal processing
      Optimization
      Permalink
      http://hdl.handle.net/11693/28397
      Published Version (Please cite this version)
      http://dx.doi.org/10.1109/SIU.2011.5929729
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      • Department of Electrical and Electronics Engineering 3524
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