Hollow-cathode plasma-assisted atomic layer deposition: A novel route for low-temperature synthesis of crystalline III-nitride thin films and nanostructures
Date
2015
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2015 IEEE 35th International Conference on Electronics and Nanotechnology (ELNANO)
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IEEE
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218 - 221
Language
English
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Abstract
Hollow cathode plasma-assisted atomic layer deposition is a promising technique for obtaining III-nitride thin films with low impurity concentrations at low temperatures. Here we report our efforts on the development of HCPA-ALD processes for III-nitrides together with the properties of resulting thin films and nanostructures. The content will further include nylon 6,6/GaN core/shell and BN/AlN bishell hollow nanofibers, proof-of-concept thin film transistors and UV photodetectors fabricated using HCPA-ALD-grown GaN layers, as well as early results for InN thin films deposited by HCPA-ALD technique. © 2015 IEEE.
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Atomic layer deposition , Atoms , Cathodes , Deposition , Electrodes , Electron sources , Low temperature effects , Nanofibers , Nanostructures , Nanotechnology , Nitrides , Photodetectors , Photons , Pulsed laser deposition , Temperature , Thin film transistors , Hollow cathodes , Hollow nanofibers , III-Nitride , Low impurity concentrations , Low temperature synthesis , Low temperatures , Proof of concept , UV photodetectors , Thin films