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      • Department of Electrical and Electronics Engineering
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      Region covariance descriptors calculated over the salient points for target tracking

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      Author
      Çakir, S.
      Aytaç, T.
      Yildirim, A.
      Beheshti, S.
      Gerek Ö.N.
      Çetin, A. Enis
      Date
      2012
      Source Title
      2012 20th Signal Processing and Communications Applications Conference (SIU)
      Publisher
      IEEE
      Language
      Turkish
      Type
      Conference Paper
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      Abstract
      Features extracted at salient points in the image are used to construct region covariance descriptor (RCD) for target tracking purposes. In the classical approach, the RCD is computed by using the features at each pixel location and thus, increases the computational cost in the scenarios where large targets are tracked. The approach in which the features at each pixel location are used, is redundant in cases where image statistics do not change significantly between neighboring pixels. Furthermore, this may decrease the tracking accuracy while tracking large targets which have background dominating structures. In the proposed approach, the salient points are extracted via the Shi and Tomasi's minimum eigenvalue method and a descriptor based target tracking structure is constructed based on the features extracted only at these salient points. Experimental results indicate that the proposed method provides comparable and in some cases even better tracking results compared to the classical method while providing a computationally more efficient structure. © 2012 IEEE.
      Keywords
      Classical approach
      Classical methods
      Computational costs
      Descriptors
      Eigenvalue methods
      Image statistics
      Pixel location
      Region covariance
      Region covariance descriptors
      Salient points
      Tracking accuracy
      Eigenvalues and eigenfunctions
      Signal processing
      Target tracking
      Permalink
      http://hdl.handle.net/11693/28207
      Published Version (Please cite this version)
      http://dx.doi.org/10.1109/SIU.2012.6204596
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      • Department of Electrical and Electronics Engineering 3524
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