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dc.contributor.authorKeskin F.en_US
dc.contributor.authorÇetin, A.E.en_US
dc.date.accessioned2016-02-08T12:13:43Z
dc.date.available2016-02-08T12:13:43Z
dc.date.issued2012en_US
dc.identifier.urihttp://hdl.handle.net/11693/28191
dc.description.abstractIn this paper, we describe a single-tree complex wavelet transform method using time-varying lifting structures. In the dualtree complex wavelet transform (DT-CWT), two different filterbanks are executed in parallel to analyze a given input signal, which increases the amount of data after analysis. DT-CWT leads to a redundancy factor of 2 d for d-dimensional signals. In the proposed single-tree complex wavelet transform (ST-CWT) structure, filters of the lifting filterbank switch back and forth between the two analysis filters of the DT-CWT. This approach does not increase the amount of output data as it is a critically sampled transform and it has the desirable properties of DT-CWT such as shift-invariance and directional selectivity. The proposed filterbank is capable of constructing a complex wavelet-like transform. Examples are presented. © 2012 IEEE.en_US
dc.language.isoTurkishen_US
dc.source.title2012 20th Signal Processing and Communications Applications Conference, SIU 2012, Proceedingsen_US
dc.relation.isversionofhttp://dx.doi.org/10.1109/SIU.2012.6204747en_US
dc.subjectComplex wavelet transformsen_US
dc.subjectDirectional selectivityen_US
dc.subjectDual-tree complex wavelet transformen_US
dc.subjectInput signalen_US
dc.subjectLifting structureen_US
dc.subjectOutput dataen_US
dc.subjectRedundancy factorsen_US
dc.subjectShift-invarianceen_US
dc.subjectTime varyingen_US
dc.subjectFilter banksen_US
dc.subjectForestryen_US
dc.subjectAnalysisen_US
dc.subjectData Processingen_US
dc.subjectDirectional Measurementen_US
dc.subjectFiltersen_US
dc.subjectSignalsen_US
dc.titleTime-varying lifting structures for single-tree complexwavelet transformen_US
dc.title.alternativeTek-ağaç karmaşik dalgacik dönüş ümü için zamanla değişen yükseltme şemalarien_US
dc.typeConference Paperen_US
dc.departmentDepartment of Electrical and Electronics Engineering
dc.identifier.doi10.1109/SIU.2012.6204747en_US


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